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Ga+ Ions and Xe+ Plasma: Complementary FIBs for Resin-Embedded Life Science Sample Analyses

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Bibliographic Details
Published in:	Microscopy and microanalysis 2014-08, Vol.20 (S3), p.332-333
Main Authors:	Riesterer, Jessica L., Kelley, Ron
Format:	Article
Language:	English
Subjects:	15 Years of Focused Ion Beams at M & M Advances in Instrumentation Symposia
Online Access:	Get full text
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