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Large Solid Angle Silicon Drift Detectors for EDX Analysis in TEM

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Bibliographic Details
Published in:	Microscopy and microanalysis 2014-08, Vol.20 (S3), p.1124-1125
Main Authors:	Niculae, A., Bornschlegl, M., Eckhardt, R., Herrmann, J., Jeschke, S., Krenz, G., Liebel, A., Lutz, G., Soltau, H., Strüder, L.
Format:	Article
Language:	English
Subjects:	Advances in Instrumentation Symposia Vendor Symposium: New Tools for Life and Materials Sciences
Citations:	Items that cite this one
Online Access:	Get full text
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