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In-situ Switching of a Ferroelectric Film Through a Non-ferroelectric Layer and Direct Scanning Probe Analysis of the Same Cross Section

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Bibliographic Details
Published in:	Microscopy and microanalysis 2014-08, Vol.20 (S3), p.1658-1659
Main Authors:	Jokisaari, J.R., Gao, P., Pan, X.Q.
Format:	Article
Language:	English
Subjects:	Advances in In-situ Microscopy Physical Sciences Symposia
Online Access:	Get full text
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