In-situ Switching of a Ferroelectric Film Through a Non-ferroelectric Layer and Direct Scanning Probe Analysis of the Same Cross Section

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Published in:Microscopy and microanalysis 2014-08, Vol.20 (S3), p.1658-1659
Main Authors: Jokisaari, J.R., Gao, P., Pan, X.Q.
Format: Article
Language:English
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Advances in In-situ Microscopy
Physical Sciences Symposia
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creator Jokisaari, J.R.
Gao, P.
Pan, X.Q.
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subjects Advances in In-situ Microscopy
Physical Sciences Symposia
title In-situ Switching of a Ferroelectric Film Through a Non-ferroelectric Layer and Direct Scanning Probe Analysis of the Same Cross Section
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