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Concepts for an Annular Pole Piece Detector for the Simultaneous Measurement of X-Rays and Backscattered Electrons Inside a SEM

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Bibliographic Details
Published in:Microscopy and microanalysis 2014-08, Vol.20 (S3), p.1118-1119
Main Authors: Liebel, A., Eckhardt, R., Bornschlegl, M., Bechteler, A., Niculae, A., Soltau, H.
Format: Article
Language:English
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ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927614007326