Visualizing Interface Effects in Two-dimensionally Doped La2CuO4 and La2CuO4/ La2-xSrxNiO4 Superlattices

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Bibliographic Details
Published in:Microscopy and microanalysis 2016-07, Vol.22 (S3), p.268-269
Main Authors: Wang, Y., Sigle, W., Salzberger, U., Baiutti, F., Gregori, G., Christiani, G., Logvenov, G., Maier, J., van Aken, P.A.
Format: Article
Language:English
Subjects:
Analytical and Instrumentation Science Symposia
Analytical Electron Microscopy for Advanced Characterization from Multi-Dimensional Data Acquisition to Integrated Analysis
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ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927616002191