Multivariate Statistical Analysis of Series of Diffraction Patterns

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Bibliographic Details
Published in:Microscopy and microanalysis 2016-07, Vol.22 (S3), p.482-483
Main Authors: Kotula, P.G., Van Benthem, M.H., Ryll, H., Simson, M., Soltau, H.
Format: Article
Language:English
Subjects:
Advanced Scanning Diffraction: Mapping Functionality in Reciprocal Space at Nanometer Resolution
Analytical and Instrumentation Science Symposia
Datasets
Electrons
Laboratories
Microscopy
Statistical analysis
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ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927616003263