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Novel Silicon Drift Detector Devices for Ultra-Fast, High-Resolution X-ray Spectroscopy

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Bibliographic Details
Published in:	Microscopy and microanalysis 2016-07, Vol.22 (S3), p.40-41
Main Authors:	Niculae, A., Bechteler, A., Eckhardt, R., Hermenau, K., Liebel, A., Lutz, G., Soltau, H., Strüder, L.
Format:	Article
Language:	English
Subjects:	Analytical and Instrumentation Science Symposia Vendor Symposium: New Tools for Life and Materials Sciences X-ray spectroscopy
Citations:	Items that cite this one
Online Access:	Get full text
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