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THE NANOWORKBENCH: Automated Nanorobotic system inside of Scanning Electron or Focused Ion Beam Microscopes

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Bibliographic Details
Published in:	Microscopy and microanalysis 2016-07, Vol.22 (S3), p.14-15
Main Authors:	Burkart, Ivo, Burkart, Eva, Klocke, Volker, Peters, David
Format:	Article
Language:	English
Subjects:	Analytical and Instrumentation Science Symposia Vendor Symposium: New Tools for Life and Materials Sciences
Online Access:	Get full text
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