Performance of the SALVE-microscope: Atomic-resolution TEM Imaging at 20 kV

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Bibliographic Details
Published in:Microscopy and microanalysis 2016-07, Vol.22 (S3), p.878-879
Main Authors: Linck, Martin, Hartel, Peter, Uhlemann, Stephan, Kahl, Frank, Müller, Heiko, Zach, Joachim, Biskupek, Johannes, Niestadt, Marcel, Kaiser, Ute, Haider, Max
Format: Article
Language:English
Subjects:
Analytical and Instrumentation Science Symposia
Electron microscopes
Microscopy
Single Atom Electron Microscopy and Spectroscopy
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ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927616005237