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New Opportunities with Oval-shaped Silicon Drift Detectors for High-Throughput EDX Analysis in Electron Microscopy

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Bibliographic Details
Published in:	Microscopy and microanalysis 2016-07, Vol.22 (S3), p.42-43
Main Authors:	Niculae, A., Bechteler, A., Eckhardt, R., Hermenau, K., Liebel, A., Lutz, G., Schöning, A., Soltau, H., Strüder, L.
Format:	Article
Language:	English
Subjects:	Analytical and Instrumentation Science Symposia Vendor Symposium: New Tools for Life and Materials Sciences
Online Access:	Get full text
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