Loading…

Considerations and Challenges with Characterizing Si/SiGe Interfaces

Saved in:

Bibliographic Details
Published in:	Microscopy and microanalysis 2016-07, Vol.22 (S3), p.1450-1451
Main Authors:	Dyck, Ondrej, Leonard, Donovan, Poplawsky, Jonathan, Pritchett, Emily, Kiselev, Andrey A., Jackson, Clayton A., Edge, Lisa F.
Format:	Article
Language:	English
Subjects:	Combining Simulation, Experiment, and Data Science for Materials Characterization and Design Interfaces Microscopy Physical Science Symposia
Citations:	Items that this one cites
Online Access:	Get full text
Tags:	Add Tag No Tags, Be the first to tag this record!