Considerations and Challenges with Characterizing Si/SiGe Interfaces

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Published in:Microscopy and microanalysis 2016-07, Vol.22 (S3), p.1450-1451
Main Authors: Dyck, Ondrej, Leonard, Donovan, Poplawsky, Jonathan, Pritchett, Emily, Kiselev, Andrey A., Jackson, Clayton A., Edge, Lisa F.
Format: Article
Language:English
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Combining Simulation, Experiment, and Data Science for Materials Characterization and Design
Interfaces
Microscopy
Physical Science Symposia
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container_end_page 1451
container_issue S3
container_start_page 1450
container_title Microscopy and microanalysis
container_volume 22
creator Dyck, Ondrej
Leonard, Donovan
Poplawsky, Jonathan
Pritchett, Emily
Kiselev, Andrey A.
Jackson, Clayton A.
Edge, Lisa F.
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doi_str_mv 10.1017/S1431927616008096
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fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_journals_1871265013</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><cupid>10_1017_S1431927616008096</cupid><sourcerecordid>4316826661</sourcerecordid><originalsourceid>FETCH-LOGICAL-c1576-ca40620bd425e7853f7e686acc41e570b85cbbc230e4d88e11c1d71d551c06553</originalsourceid><addsrcrecordid>eNp1UE1Lw0AQXUTBWv0B3gKeY2ey2Y8eJWotFDxUz2GzO2m3tEndTRH99U1tD4J4mjdv3nsDj7FbhHsEVKM55hzHmZIoATSM5Rkb9JRINaI4_8GYHu6X7CrGFQBwUHLAHou2id5RMJ3vUWIalxRLs15Ts6CYfPpuediDsR0F_-2bRTL3o7mfUDJteqo2luI1u6jNOtLNaQ7Z-_PTW_GSzl4n0-JhlloUSqbW5CAzqFyeCVJa8FqR1NJYmyMJBZUWtqpsxoFypzUhWnQKnRBoQQrBh-zumLsN7ceOYleu2l1o-pclaoWZFIC8V-FRZUMbY6C63Aa_MeGrRCgPZZV_yuo9_OQxmyp4t6Bf0f-69m5lajA</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1871265013</pqid></control><display><type>article</type><title>Considerations and Challenges with Characterizing Si/SiGe Interfaces</title><source>Cambridge University Press</source><creator>Dyck, Ondrej ; Leonard, Donovan ; Poplawsky, Jonathan ; Pritchett, Emily ; Kiselev, Andrey A. ; Jackson, Clayton A. ; Edge, Lisa F.</creator><creatorcontrib>Dyck, Ondrej ; Leonard, Donovan ; Poplawsky, Jonathan ; Pritchett, Emily ; Kiselev, Andrey A. ; Jackson, Clayton A. ; Edge, Lisa F.</creatorcontrib><identifier>ISSN: 1431-9276</identifier><identifier>EISSN: 1435-8115</identifier><identifier>DOI: 10.1017/S1431927616008096</identifier><language>eng</language><publisher>New York, USA: Cambridge University Press</publisher><subject>Combining Simulation, Experiment, and Data Science for Materials Characterization and Design ; Interfaces ; Microscopy ; Physical Science Symposia</subject><ispartof>Microscopy and microanalysis, 2016-07, Vol.22 (S3), p.1450-1451</ispartof><rights>Microscopy Society of America 2016</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c1576-ca40620bd425e7853f7e686acc41e570b85cbbc230e4d88e11c1d71d551c06553</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://www.cambridge.org/core/product/identifier/S1431927616008096/type/journal_article$$EHTML$$P50$$Gcambridge$$H</linktohtml><link.rule.ids>314,777,781,27905,27906,72709</link.rule.ids></links><search><creatorcontrib>Dyck, Ondrej</creatorcontrib><creatorcontrib>Leonard, Donovan</creatorcontrib><creatorcontrib>Poplawsky, Jonathan</creatorcontrib><creatorcontrib>Pritchett, Emily</creatorcontrib><creatorcontrib>Kiselev, Andrey A.</creatorcontrib><creatorcontrib>Jackson, Clayton A.</creatorcontrib><creatorcontrib>Edge, Lisa F.</creatorcontrib><title>Considerations and Challenges with Characterizing Si/SiGe Interfaces</title><title>Microscopy and microanalysis</title><addtitle>Microsc Microanal</addtitle><subject>Combining Simulation, Experiment, and Data Science for Materials Characterization and Design</subject><subject>Interfaces</subject><subject>Microscopy</subject><subject>Physical Science Symposia</subject><issn>1431-9276</issn><issn>1435-8115</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2016</creationdate><recordtype>article</recordtype><recordid>eNp1UE1Lw0AQXUTBWv0B3gKeY2ey2Y8eJWotFDxUz2GzO2m3tEndTRH99U1tD4J4mjdv3nsDj7FbhHsEVKM55hzHmZIoATSM5Rkb9JRINaI4_8GYHu6X7CrGFQBwUHLAHou2id5RMJ3vUWIalxRLs15Ts6CYfPpuediDsR0F_-2bRTL3o7mfUDJteqo2luI1u6jNOtLNaQ7Z-_PTW_GSzl4n0-JhlloUSqbW5CAzqFyeCVJa8FqR1NJYmyMJBZUWtqpsxoFypzUhWnQKnRBoQQrBh-zumLsN7ceOYleu2l1o-pclaoWZFIC8V-FRZUMbY6C63Aa_MeGrRCgPZZV_yuo9_OQxmyp4t6Bf0f-69m5lajA</recordid><startdate>201607</startdate><enddate>201607</enddate><creator>Dyck, Ondrej</creator><creator>Leonard, Donovan</creator><creator>Poplawsky, Jonathan</creator><creator>Pritchett, Emily</creator><creator>Kiselev, Andrey A.</creator><creator>Jackson, Clayton A.</creator><creator>Edge, Lisa F.</creator><general>Cambridge University Press</general><general>Oxford University Press</general><scope>AAYXX</scope><scope>CITATION</scope><scope>3V.</scope><scope>7QO</scope><scope>7RV</scope><scope>7TK</scope><scope>7X7</scope><scope>7XB</scope><scope>88E</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>8FH</scope><scope>8FI</scope><scope>8FJ</scope><scope>8FK</scope><scope>ABUWG</scope><scope>AEUYN</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>AZQEC</scope><scope>BBNVY</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>BHPHI</scope><scope>CCPQU</scope><scope>DWQXO</scope><scope>FR3</scope><scope>FYUFA</scope><scope>GHDGH</scope><scope>GNUQQ</scope><scope>HCIFZ</scope><scope>K9.</scope><scope>KB0</scope><scope>LK8</scope><scope>M0S</scope><scope>M1P</scope><scope>M7P</scope><scope>NAPCQ</scope><scope>P5Z</scope><scope>P62</scope><scope>P64</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope></search><sort><creationdate>201607</creationdate><title>Considerations and Challenges with Characterizing Si/SiGe Interfaces</title><author>Dyck, Ondrej ; Leonard, Donovan ; Poplawsky, Jonathan ; Pritchett, Emily ; Kiselev, Andrey A. ; Jackson, Clayton A. ; Edge, Lisa F.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c1576-ca40620bd425e7853f7e686acc41e570b85cbbc230e4d88e11c1d71d551c06553</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2016</creationdate><topic>Combining Simulation, Experiment, and Data Science for Materials Characterization and Design</topic><topic>Interfaces</topic><topic>Microscopy</topic><topic>Physical Science Symposia</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Dyck, Ondrej</creatorcontrib><creatorcontrib>Leonard, Donovan</creatorcontrib><creatorcontrib>Poplawsky, Jonathan</creatorcontrib><creatorcontrib>Pritchett, Emily</creatorcontrib><creatorcontrib>Kiselev, Andrey A.</creatorcontrib><creatorcontrib>Jackson, Clayton A.</creatorcontrib><creatorcontrib>Edge, Lisa F.</creatorcontrib><collection>CrossRef</collection><collection>ProQuest Central (Corporate)</collection><collection>Biotechnology Research Abstracts</collection><collection>ProQuest Nursing &amp; Allied Health Database</collection><collection>Neurosciences Abstracts</collection><collection>ProQuest Health and Medical</collection><collection>ProQuest Central (purchase pre-March 2016)</collection><collection>Medical Database (Alumni Edition)</collection><collection>Technology Research Database</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>ProQuest Natural Science Collection</collection><collection>Hospital Premium Collection</collection><collection>Hospital Premium Collection (Alumni Edition)</collection><collection>ProQuest Central (Alumni) (purchase pre-March 2016)</collection><collection>ProQuest Central (Alumni)</collection><collection>ProQuest One Sustainability</collection><collection>ProQuest Central</collection><collection>Advanced Technologies &amp; Aerospace Collection</collection><collection>ProQuest Central Essentials</collection><collection>Biological Science Collection</collection><collection>AUTh Library subscriptions: ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest Natural Science Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Central</collection><collection>Engineering Research Database</collection><collection>Health Research Premium Collection</collection><collection>Health Research Premium Collection (Alumni)</collection><collection>ProQuest Central Student</collection><collection>SciTech Premium Collection</collection><collection>ProQuest Health &amp; Medical Complete (Alumni)</collection><collection>Nursing &amp; Allied Health Database (Alumni Edition)</collection><collection>ProQuest Biological Science Collection</collection><collection>Health &amp; Medical Collection (Alumni Edition)</collection><collection>Medical Database</collection><collection>ProQuest Biological Science Journals</collection><collection>Nursing &amp; Allied Health Premium</collection><collection>Advanced Technologies &amp; Aerospace Database</collection><collection>ProQuest Advanced Technologies &amp; Aerospace Collection</collection><collection>Biotechnology and BioEngineering Abstracts</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><jtitle>Microscopy and microanalysis</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Dyck, Ondrej</au><au>Leonard, Donovan</au><au>Poplawsky, Jonathan</au><au>Pritchett, Emily</au><au>Kiselev, Andrey A.</au><au>Jackson, Clayton A.</au><au>Edge, Lisa F.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Considerations and Challenges with Characterizing Si/SiGe Interfaces</atitle><jtitle>Microscopy and microanalysis</jtitle><addtitle>Microsc Microanal</addtitle><date>2016-07</date><risdate>2016</risdate><volume>22</volume><issue>S3</issue><spage>1450</spage><epage>1451</epage><pages>1450-1451</pages><issn>1431-9276</issn><eissn>1435-8115</eissn><cop>New York, USA</cop><pub>Cambridge University Press</pub><doi>10.1017/S1431927616008096</doi><tpages>2</tpages><oa>free_for_read</oa></addata></record>
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1435-8115
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source Cambridge University Press
subjects Combining Simulation, Experiment, and Data Science for Materials Characterization and Design
Interfaces
Microscopy
Physical Science Symposia
title Considerations and Challenges with Characterizing Si/SiGe Interfaces
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-21T07%3A03%3A43IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Considerations%20and%20Challenges%20with%20Characterizing%20Si/SiGe%20Interfaces&rft.jtitle=Microscopy%20and%20microanalysis&rft.au=Dyck,%20Ondrej&rft.date=2016-07&rft.volume=22&rft.issue=S3&rft.spage=1450&rft.epage=1451&rft.pages=1450-1451&rft.issn=1431-9276&rft.eissn=1435-8115&rft_id=info:doi/10.1017/S1431927616008096&rft_dat=%3Cproquest_cross%3E4316826661%3C/proquest_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c1576-ca40620bd425e7853f7e686acc41e570b85cbbc230e4d88e11c1d71d551c06553%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=1871265013&rft_id=info:pmid/&rft_cupid=10_1017_S1431927616008096&rfr_iscdi=true