Probing the subtleties of atomic distortions through accurate STEM imaging and density functional theory

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Bibliographic Details
Published in:Microscopy and microanalysis 2016-07, Vol.22 (S3), p.1400-1401
Main Authors: LeBeau, James, Sang, Xiahan, Dycus, J. Houston, Nui, Changning, Irving, Douglas
Format: Article
Language:English
Subjects:
Accuracy
Applied physics
Combining Simulation, Experiment, and Data Science for Materials Characterization and Design
Physical Science Symposia
Transmission electron microscopy
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ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927616007844