Big, deep, and smart data from atomically resolved images: exploring the origins of materials functionality

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Bibliographic Details
Published in:Microscopy and microanalysis 2016-07, Vol.22 (S3), p.1416-1417
Main Authors: Kalinin, S.V., Vasudevan, R., Borisevich, A., Belianinov, A., Archibald, R.K., Symons, C., Lingerfelt, E., Sumpter, B., Vlcek, L., Jesse, S.
Format: Article
Language:English
Subjects:
Combining Simulation, Experiment, and Data Science for Materials Characterization and Design
Fourier transforms
Materials science
Microscopy
Physical Science Symposia
Physics
Segregation
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ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927616007923