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Correlated Atomic Force Microscopy and Single Molecule Localization Microscopy

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Bibliographic Details
Published in:Microscopy and microanalysis 2015-08, Vol.21 (S3), p.1625-1626
Main Authors: Odermatt, Pascal D., Shivanandan, Arun, Deschout, Hendrik, Jankele, Radek, Nievergelt, Adrian, P., Feletti, Lely, Davidson, Michael W., Radenovic, Aleksandra, Fantner, Georg E.
Format: Article
Language:English
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ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927615008909