Data Quality Improvements in the Voltage-Pulsed LEAP 5000 R/XR

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Bibliographic Details
Published in:Microscopy and microanalysis 2015-08, Vol.21 (S3), p.41-42
Main Authors: Ulfig, R.M., Prosa, T.J., Lenz, D.R, Payne, T.R.
Format: Article
Language:English
Subjects:
A13 Advancing Data Collection and Analysis for Atom Probe Tomography
Analytical and Instrumentation Science Symposia
Microscopy
Tomography
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ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927615001002