Loading…

Data Quality Improvements in the Voltage-Pulsed LEAP 5000 R/XR

Saved in:
Bibliographic Details
Published in:Microscopy and microanalysis 2015-08, Vol.21 (S3), p.41-42
Main Authors: Ulfig, R.M., Prosa, T.J., Lenz, D.R, Payne, T.R.
Format: Article
Language:English
Subjects:
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
cited_by cdi_FETCH-LOGICAL-c2052-7d33fc67155f4a486e86369c4875c5c635f8386a80607c857342783d648d218a3
cites cdi_FETCH-LOGICAL-c2052-7d33fc67155f4a486e86369c4875c5c635f8386a80607c857342783d648d218a3
container_end_page 42
container_issue S3
container_start_page 41
container_title Microscopy and microanalysis
container_volume 21
creator Ulfig, R.M.
Prosa, T.J.
Lenz, D.R
Payne, T.R.
description
doi_str_mv 10.1017/S1431927615001002
format article
fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_journals_1871738008</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><cupid>10_1017_S1431927615001002</cupid><sourcerecordid>4317038901</sourcerecordid><originalsourceid>FETCH-LOGICAL-c2052-7d33fc67155f4a486e86369c4875c5c635f8386a80607c857342783d648d218a3</originalsourceid><addsrcrecordid>eNp1UE1Lw0AQXUTBWv0B3hY8x85ks7vTi1Bqq4WCtX7gLazJpqY0Td1NhP57t7YHQTzN8OZ9DI-xS4RrBNS9J0wE9mOtUAIgQHzEOgGSESHK458do939lJ15vwQAAVp12M2taQx_bM2qbLZ8Um1c_WUru248L9e8-bD8tV41ZmGjWbvyNufT0WDGQwbwee9tfs5OChPwi8Psspfx6Hl4H00f7ibDwTTKYpBxpHMhikxplLJITELKkhKqnyWkZSYzJWRBgpQhUKAzkloksSaRq4TyGMmILrva-4b_Plvrm3RZt24dIlMkjVoQAAUW7lmZq713tkg3rqyM26YI6a6m9E9NQSMOGlO9uzJf2F_W_6q-ASM1ZD4</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1871738008</pqid></control><display><type>article</type><title>Data Quality Improvements in the Voltage-Pulsed LEAP 5000 R/XR</title><source>Cambridge University Press</source><creator>Ulfig, R.M. ; Prosa, T.J. ; Lenz, D.R ; Payne, T.R.</creator><creatorcontrib>Ulfig, R.M. ; Prosa, T.J. ; Lenz, D.R ; Payne, T.R.</creatorcontrib><identifier>ISSN: 1431-9276</identifier><identifier>EISSN: 1435-8115</identifier><identifier>DOI: 10.1017/S1431927615001002</identifier><language>eng</language><publisher>New York, USA: Cambridge University Press</publisher><subject>A13 Advancing Data Collection and Analysis for Atom Probe Tomography ; Analytical and Instrumentation Science Symposia ; Microscopy ; Tomography</subject><ispartof>Microscopy and microanalysis, 2015-08, Vol.21 (S3), p.41-42</ispartof><rights>Copyright © Microscopy Society of America 2015</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c2052-7d33fc67155f4a486e86369c4875c5c635f8386a80607c857342783d648d218a3</citedby><cites>FETCH-LOGICAL-c2052-7d33fc67155f4a486e86369c4875c5c635f8386a80607c857342783d648d218a3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://www.cambridge.org/core/product/identifier/S1431927615001002/type/journal_article$$EHTML$$P50$$Gcambridge$$H</linktohtml><link.rule.ids>314,780,784,27924,27925,72960</link.rule.ids></links><search><creatorcontrib>Ulfig, R.M.</creatorcontrib><creatorcontrib>Prosa, T.J.</creatorcontrib><creatorcontrib>Lenz, D.R</creatorcontrib><creatorcontrib>Payne, T.R.</creatorcontrib><title>Data Quality Improvements in the Voltage-Pulsed LEAP 5000 R/XR</title><title>Microscopy and microanalysis</title><addtitle>Microsc Microanal</addtitle><subject>A13 Advancing Data Collection and Analysis for Atom Probe Tomography</subject><subject>Analytical and Instrumentation Science Symposia</subject><subject>Microscopy</subject><subject>Tomography</subject><issn>1431-9276</issn><issn>1435-8115</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2015</creationdate><recordtype>article</recordtype><recordid>eNp1UE1Lw0AQXUTBWv0B3hY8x85ks7vTi1Bqq4WCtX7gLazJpqY0Td1NhP57t7YHQTzN8OZ9DI-xS4RrBNS9J0wE9mOtUAIgQHzEOgGSESHK458do939lJ15vwQAAVp12M2taQx_bM2qbLZ8Um1c_WUru248L9e8-bD8tV41ZmGjWbvyNufT0WDGQwbwee9tfs5OChPwi8Psspfx6Hl4H00f7ibDwTTKYpBxpHMhikxplLJITELKkhKqnyWkZSYzJWRBgpQhUKAzkloksSaRq4TyGMmILrva-4b_Plvrm3RZt24dIlMkjVoQAAUW7lmZq713tkg3rqyM26YI6a6m9E9NQSMOGlO9uzJf2F_W_6q-ASM1ZD4</recordid><startdate>201508</startdate><enddate>201508</enddate><creator>Ulfig, R.M.</creator><creator>Prosa, T.J.</creator><creator>Lenz, D.R</creator><creator>Payne, T.R.</creator><general>Cambridge University Press</general><general>Oxford University Press</general><scope>AAYXX</scope><scope>CITATION</scope><scope>3V.</scope><scope>7QO</scope><scope>7RV</scope><scope>7TK</scope><scope>7X7</scope><scope>7XB</scope><scope>88E</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>8FH</scope><scope>8FI</scope><scope>8FJ</scope><scope>8FK</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>AZQEC</scope><scope>BBNVY</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>BHPHI</scope><scope>CCPQU</scope><scope>DWQXO</scope><scope>FR3</scope><scope>FYUFA</scope><scope>GHDGH</scope><scope>GNUQQ</scope><scope>HCIFZ</scope><scope>K9.</scope><scope>KB0</scope><scope>LK8</scope><scope>M0S</scope><scope>M1P</scope><scope>M7P</scope><scope>NAPCQ</scope><scope>P5Z</scope><scope>P62</scope><scope>P64</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope></search><sort><creationdate>201508</creationdate><title>Data Quality Improvements in the Voltage-Pulsed LEAP 5000 R/XR</title><author>Ulfig, R.M. ; Prosa, T.J. ; Lenz, D.R ; Payne, T.R.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c2052-7d33fc67155f4a486e86369c4875c5c635f8386a80607c857342783d648d218a3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2015</creationdate><topic>A13 Advancing Data Collection and Analysis for Atom Probe Tomography</topic><topic>Analytical and Instrumentation Science Symposia</topic><topic>Microscopy</topic><topic>Tomography</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Ulfig, R.M.</creatorcontrib><creatorcontrib>Prosa, T.J.</creatorcontrib><creatorcontrib>Lenz, D.R</creatorcontrib><creatorcontrib>Payne, T.R.</creatorcontrib><collection>CrossRef</collection><collection>ProQuest Central (Corporate)</collection><collection>Biotechnology Research Abstracts</collection><collection>Nursing &amp; Allied Health Database</collection><collection>Neurosciences Abstracts</collection><collection>ProQuest Health and Medical</collection><collection>ProQuest Central (purchase pre-March 2016)</collection><collection>Medical Database (Alumni Edition)</collection><collection>Technology Research Database</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>ProQuest Natural Science Collection</collection><collection>Hospital Premium Collection</collection><collection>Hospital Premium Collection (Alumni Edition)</collection><collection>ProQuest Central (Alumni) (purchase pre-March 2016)</collection><collection>ProQuest Central (Alumni)</collection><collection>ProQuest Central</collection><collection>Advanced Technologies &amp; Aerospace Database‎ (1962 - current)</collection><collection>ProQuest Central Essentials</collection><collection>Biological Science Collection</collection><collection>AUTh Library subscriptions: ProQuest Central</collection><collection>Technology Collection</collection><collection>Natural Science Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Central Korea</collection><collection>Engineering Research Database</collection><collection>Health Research Premium Collection</collection><collection>Health Research Premium Collection (Alumni)</collection><collection>ProQuest Central Student</collection><collection>SciTech Premium Collection</collection><collection>ProQuest Health &amp; Medical Complete (Alumni)</collection><collection>Nursing &amp; Allied Health Database (Alumni Edition)</collection><collection>ProQuest Biological Science Collection</collection><collection>Health &amp; Medical Collection (Alumni Edition)</collection><collection>PML(ProQuest Medical Library)</collection><collection>Biological Science Database</collection><collection>Nursing &amp; Allied Health Premium</collection><collection>ProQuest advanced technologies &amp; aerospace journals</collection><collection>ProQuest Advanced Technologies &amp; Aerospace Collection</collection><collection>Biotechnology and BioEngineering Abstracts</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><jtitle>Microscopy and microanalysis</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Ulfig, R.M.</au><au>Prosa, T.J.</au><au>Lenz, D.R</au><au>Payne, T.R.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Data Quality Improvements in the Voltage-Pulsed LEAP 5000 R/XR</atitle><jtitle>Microscopy and microanalysis</jtitle><addtitle>Microsc Microanal</addtitle><date>2015-08</date><risdate>2015</risdate><volume>21</volume><issue>S3</issue><spage>41</spage><epage>42</epage><pages>41-42</pages><issn>1431-9276</issn><eissn>1435-8115</eissn><cop>New York, USA</cop><pub>Cambridge University Press</pub><doi>10.1017/S1431927615001002</doi><tpages>2</tpages><oa>free_for_read</oa></addata></record>
fulltext fulltext
identifier ISSN: 1431-9276
ispartof Microscopy and microanalysis, 2015-08, Vol.21 (S3), p.41-42
issn 1431-9276
1435-8115
language eng
recordid cdi_proquest_journals_1871738008
source Cambridge University Press
subjects A13 Advancing Data Collection and Analysis for Atom Probe Tomography
Analytical and Instrumentation Science Symposia
Microscopy
Tomography
title Data Quality Improvements in the Voltage-Pulsed LEAP 5000 R/XR
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-24T14%3A22%3A14IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Data%20Quality%20Improvements%20in%20the%20Voltage-Pulsed%20LEAP%205000%20R/XR&rft.jtitle=Microscopy%20and%20microanalysis&rft.au=Ulfig,%20R.M.&rft.date=2015-08&rft.volume=21&rft.issue=S3&rft.spage=41&rft.epage=42&rft.pages=41-42&rft.issn=1431-9276&rft.eissn=1435-8115&rft_id=info:doi/10.1017/S1431927615001002&rft_dat=%3Cproquest_cross%3E4317038901%3C/proquest_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c2052-7d33fc67155f4a486e86369c4875c5c635f8386a80607c857342783d648d218a3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=1871738008&rft_id=info:pmid/&rft_cupid=10_1017_S1431927615001002&rfr_iscdi=true