Studying Shocked Material Dynamics with Ultrafast X-rays

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Bibliographic Details
Published in:Microscopy and microanalysis 2015-08, Vol.21 (S3), p.1851-1852
Main Authors: Sandberg, R.L., Bolme, C., Ramos, K., McCulloch, Q., Martinez, R., Hamilton, V., Pierce, T., Greenfield, M., McGrane, S., Barber, J.L., Abbey, B., Schropp, A., Seiboth, F., Heiman, P., Nagler, B., Galtier, E., Granados, E.
Format: Article
Language:English
Subjects:
A05 Fast and Ultrafast Imaging with Electrons and Photons
Analytical and Instrumentation Science Symposia
Lasers
Sensors
Single crystals
X-rays
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ISSN:1431-9276
1435-8115
DOI:10.1017/S143192761501003X