Cyclic Voltammetry Measurement for n-Type Cu2O Thin Film Using Copper Sulphate-Based Solution

• Published in: Key engineering materials 2017-02, Vol.730, p.119-124
• Main Authors: Mohamad, Fariza, Muhd Nor, Nik Hisyamudin, binti Mohd Hanif, Asyikin Sasha, Cheong, Kah Hao, binti Mohamad Arifin, Nurliyana, binti Zinal, Nabiah, Izaki, Masanobu
• Format: Article
• Language: English
• ISSN: 1013-9826; 1662-9795; 1662-9795
• DOI: 10.4028/www.scientific.net/KEM.730.119

Cuprous oxide (Cu2O) is a promising material for solar cell application. Due to its various advantages over silicon material, it has been exploited extensively to be use in photovoltaic cell. Cu2O thin films were electrodeposited in sulfate-based solution. Cyclic voltammorgram (CV) measurement was used to investigate the reduction process under controlled parameters. Deposition potential of-0.1V vs. Ag/AgCl was used for the fabrication of Cu2O thin film based on the CV measurement. CV also revealed that the deposition speed was dependent on the bath pH and the temperature. X-ray diffraction (XRD) measurement, Field Emission Scanning-Electron Microscopy (FE-SEM) and Ultraviolet-visible spectroscopy (UV-Vis) were performed to characterize the deposited thin films. The n-Cu2O was successfully fabricated on FTO glass substrate with (111)-prefered orientation. Surface morphology of the thin films were observed to be in flower-like shape combination with pyramidal and triangular shape.