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Analysis of reliability of semiconductor emitters with different designs of cavities
We have reported on the results of analysis of the operating time of conventional laser diodes and diodes with noninjecting output sections. The reasons for shorter operating time of diodes with a single anti-reflection face of the cavity compared to diodes with two protecting coatings and emitters...
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Published in: | Technical physics 2016-10, Vol.61 (10), p.1525-1530 |
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container_title | Technical physics |
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creator | Ivanov, A. V. Kurnosov, V. D. Kurnosov, K. V. Kurnyavko, Yu. V. Lobintsov, A. V. Meshkov, A. S. Penkin, V. N. Romantsevich, V. I. Uspenskii, M. B. Chernov, R. V. |
description | We have reported on the results of analysis of the operating time of conventional laser diodes and diodes with noninjecting output sections. The reasons for shorter operating time of diodes with a single anti-reflection face of the cavity compared to diodes with two protecting coatings and emitters equipped with a fiber Bragg grating have been considered. |
doi_str_mv | 10.1134/S1063784216100157 |
format | article |
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The reasons for shorter operating time of diodes with a single anti-reflection face of the cavity compared to diodes with two protecting coatings and emitters equipped with a fiber Bragg grating have been considered.</description><identifier>ISSN: 1063-7842</identifier><identifier>EISSN: 1090-6525</identifier><identifier>DOI: 10.1134/S1063784216100157</identifier><language>eng</language><publisher>Moscow: Pleiades Publishing</publisher><subject>Analysis ; Classical and Continuum Physics ; Coatings ; Emitters ; Holes ; Lasers ; LEDs ; Physics ; Physics and Astronomy ; Protective coatings ; Reliability analysis ; Repair & maintenance ; Semiconductor lasers ; Solid State Electronics</subject><ispartof>Technical physics, 2016-10, Vol.61 (10), p.1525-1530</ispartof><rights>Pleiades Publishing, Ltd. 2016</rights><rights>COPYRIGHT 2016 Springer</rights><rights>Copyright Springer Science & Business Media 2016</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c307t-49e0b2173e7335a61bc7da364067f226be4c21ff8e8495eb1f20891e27d622963</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27922,27923</link.rule.ids></links><search><creatorcontrib>Ivanov, A. 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subjects | Analysis Classical and Continuum Physics Coatings Emitters Holes Lasers LEDs Physics Physics and Astronomy Protective coatings Reliability analysis Repair & maintenance Semiconductor lasers Solid State Electronics |
title | Analysis of reliability of semiconductor emitters with different designs of cavities |
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