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Analysis of reliability of semiconductor emitters with different designs of cavities

We have reported on the results of analysis of the operating time of conventional laser diodes and diodes with noninjecting output sections. The reasons for shorter operating time of diodes with a single anti-reflection face of the cavity compared to diodes with two protecting coatings and emitters...

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Published in:Technical physics 2016-10, Vol.61 (10), p.1525-1530
Main Authors: Ivanov, A. V., Kurnosov, V. D., Kurnosov, K. V., Kurnyavko, Yu. V., Lobintsov, A. V., Meshkov, A. S., Penkin, V. N., Romantsevich, V. I., Uspenskii, M. B., Chernov, R. V.
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container_end_page 1530
container_issue 10
container_start_page 1525
container_title Technical physics
container_volume 61
creator Ivanov, A. V.
Kurnosov, V. D.
Kurnosov, K. V.
Kurnyavko, Yu. V.
Lobintsov, A. V.
Meshkov, A. S.
Penkin, V. N.
Romantsevich, V. I.
Uspenskii, M. B.
Chernov, R. V.
description We have reported on the results of analysis of the operating time of conventional laser diodes and diodes with noninjecting output sections. The reasons for shorter operating time of diodes with a single anti-reflection face of the cavity compared to diodes with two protecting coatings and emitters equipped with a fiber Bragg grating have been considered.
doi_str_mv 10.1134/S1063784216100157
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fullrecord <record><control><sourceid>gale_proqu</sourceid><recordid>TN_cdi_proquest_journals_1880852882</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><galeid>A495831641</galeid><sourcerecordid>A495831641</sourcerecordid><originalsourceid>FETCH-LOGICAL-c307t-49e0b2173e7335a61bc7da364067f226be4c21ff8e8495eb1f20891e27d622963</originalsourceid><addsrcrecordid>eNp1kE1PwzAMhiMEEmPwA7hV4twRJ22SHqeJL2kSB8a5SlNnZOrakWSg_XsyygEJoRyc136fxDYh10BnALy4fQEquFQFAwGUQilPyARoRXNRsvL0eBc8P9bPyUUIm2QBVYoJWc173R2CC9lgM4-d043rXDwcZcCtM0Pf7k0cfJZEjOhD9uniW9Y6a9FjH7MWg1v337zRHy46DJfkzOou4NVPnJLX-7vV4jFfPj88LebL3HAqY15USBsGkqPkvNQCGiNbzUVBhbSMiQYLw8BahaqoSmzAMqoqQCZbwVgl-JTcjO_u_PC-xxDrzbD3aaBQg1JUlUwpllyz0bXWHdaut0P02qTTjvOhdSk_T18oDqKABMAIGD-E4NHWO--22h9qoPVx2_WfbSeGjUxI3n6N_lcr_0JfELaAZQ</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1880852882</pqid></control><display><type>article</type><title>Analysis of reliability of semiconductor emitters with different designs of cavities</title><source>Springer Nature</source><creator>Ivanov, A. V. ; Kurnosov, V. D. ; Kurnosov, K. V. ; Kurnyavko, Yu. V. ; Lobintsov, A. V. ; Meshkov, A. S. ; Penkin, V. N. ; Romantsevich, V. I. ; Uspenskii, M. B. ; Chernov, R. V.</creator><creatorcontrib>Ivanov, A. V. ; Kurnosov, V. D. ; Kurnosov, K. V. ; Kurnyavko, Yu. V. ; Lobintsov, A. V. ; Meshkov, A. S. ; Penkin, V. N. ; Romantsevich, V. I. ; Uspenskii, M. B. ; Chernov, R. V.</creatorcontrib><description>We have reported on the results of analysis of the operating time of conventional laser diodes and diodes with noninjecting output sections. The reasons for shorter operating time of diodes with a single anti-reflection face of the cavity compared to diodes with two protecting coatings and emitters equipped with a fiber Bragg grating have been considered.</description><identifier>ISSN: 1063-7842</identifier><identifier>EISSN: 1090-6525</identifier><identifier>DOI: 10.1134/S1063784216100157</identifier><language>eng</language><publisher>Moscow: Pleiades Publishing</publisher><subject>Analysis ; Classical and Continuum Physics ; Coatings ; Emitters ; Holes ; Lasers ; LEDs ; Physics ; Physics and Astronomy ; Protective coatings ; Reliability analysis ; Repair &amp; maintenance ; Semiconductor lasers ; Solid State Electronics</subject><ispartof>Technical physics, 2016-10, Vol.61 (10), p.1525-1530</ispartof><rights>Pleiades Publishing, Ltd. 2016</rights><rights>COPYRIGHT 2016 Springer</rights><rights>Copyright Springer Science &amp; Business Media 2016</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c307t-49e0b2173e7335a61bc7da364067f226be4c21ff8e8495eb1f20891e27d622963</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27922,27923</link.rule.ids></links><search><creatorcontrib>Ivanov, A. V.</creatorcontrib><creatorcontrib>Kurnosov, V. D.</creatorcontrib><creatorcontrib>Kurnosov, K. V.</creatorcontrib><creatorcontrib>Kurnyavko, Yu. V.</creatorcontrib><creatorcontrib>Lobintsov, A. V.</creatorcontrib><creatorcontrib>Meshkov, A. S.</creatorcontrib><creatorcontrib>Penkin, V. N.</creatorcontrib><creatorcontrib>Romantsevich, V. I.</creatorcontrib><creatorcontrib>Uspenskii, M. B.</creatorcontrib><creatorcontrib>Chernov, R. V.</creatorcontrib><title>Analysis of reliability of semiconductor emitters with different designs of cavities</title><title>Technical physics</title><addtitle>Tech. Phys</addtitle><description>We have reported on the results of analysis of the operating time of conventional laser diodes and diodes with noninjecting output sections. The reasons for shorter operating time of diodes with a single anti-reflection face of the cavity compared to diodes with two protecting coatings and emitters equipped with a fiber Bragg grating have been considered.</description><subject>Analysis</subject><subject>Classical and Continuum Physics</subject><subject>Coatings</subject><subject>Emitters</subject><subject>Holes</subject><subject>Lasers</subject><subject>LEDs</subject><subject>Physics</subject><subject>Physics and Astronomy</subject><subject>Protective coatings</subject><subject>Reliability analysis</subject><subject>Repair &amp; maintenance</subject><subject>Semiconductor lasers</subject><subject>Solid State Electronics</subject><issn>1063-7842</issn><issn>1090-6525</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2016</creationdate><recordtype>article</recordtype><recordid>eNp1kE1PwzAMhiMEEmPwA7hV4twRJ22SHqeJL2kSB8a5SlNnZOrakWSg_XsyygEJoRyc136fxDYh10BnALy4fQEquFQFAwGUQilPyARoRXNRsvL0eBc8P9bPyUUIm2QBVYoJWc173R2CC9lgM4-d043rXDwcZcCtM0Pf7k0cfJZEjOhD9uniW9Y6a9FjH7MWg1v337zRHy46DJfkzOou4NVPnJLX-7vV4jFfPj88LebL3HAqY15USBsGkqPkvNQCGiNbzUVBhbSMiQYLw8BahaqoSmzAMqoqQCZbwVgl-JTcjO_u_PC-xxDrzbD3aaBQg1JUlUwpllyz0bXWHdaut0P02qTTjvOhdSk_T18oDqKABMAIGD-E4NHWO--22h9qoPVx2_WfbSeGjUxI3n6N_lcr_0JfELaAZQ</recordid><startdate>20161001</startdate><enddate>20161001</enddate><creator>Ivanov, A. V.</creator><creator>Kurnosov, V. D.</creator><creator>Kurnosov, K. V.</creator><creator>Kurnyavko, Yu. V.</creator><creator>Lobintsov, A. V.</creator><creator>Meshkov, A. S.</creator><creator>Penkin, V. N.</creator><creator>Romantsevich, V. I.</creator><creator>Uspenskii, M. B.</creator><creator>Chernov, R. V.</creator><general>Pleiades Publishing</general><general>Springer</general><general>Springer Nature B.V</general><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20161001</creationdate><title>Analysis of reliability of semiconductor emitters with different designs of cavities</title><author>Ivanov, A. V. ; Kurnosov, V. D. ; Kurnosov, K. V. ; Kurnyavko, Yu. V. ; Lobintsov, A. V. ; Meshkov, A. S. ; Penkin, V. N. ; Romantsevich, V. I. ; Uspenskii, M. B. ; Chernov, R. V.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c307t-49e0b2173e7335a61bc7da364067f226be4c21ff8e8495eb1f20891e27d622963</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2016</creationdate><topic>Analysis</topic><topic>Classical and Continuum Physics</topic><topic>Coatings</topic><topic>Emitters</topic><topic>Holes</topic><topic>Lasers</topic><topic>LEDs</topic><topic>Physics</topic><topic>Physics and Astronomy</topic><topic>Protective coatings</topic><topic>Reliability analysis</topic><topic>Repair &amp; maintenance</topic><topic>Semiconductor lasers</topic><topic>Solid State Electronics</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Ivanov, A. V.</creatorcontrib><creatorcontrib>Kurnosov, V. D.</creatorcontrib><creatorcontrib>Kurnosov, K. V.</creatorcontrib><creatorcontrib>Kurnyavko, Yu. V.</creatorcontrib><creatorcontrib>Lobintsov, A. V.</creatorcontrib><creatorcontrib>Meshkov, A. S.</creatorcontrib><creatorcontrib>Penkin, V. N.</creatorcontrib><creatorcontrib>Romantsevich, V. I.</creatorcontrib><creatorcontrib>Uspenskii, M. B.</creatorcontrib><creatorcontrib>Chernov, R. V.</creatorcontrib><collection>CrossRef</collection><jtitle>Technical physics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Ivanov, A. V.</au><au>Kurnosov, V. D.</au><au>Kurnosov, K. V.</au><au>Kurnyavko, Yu. V.</au><au>Lobintsov, A. V.</au><au>Meshkov, A. S.</au><au>Penkin, V. N.</au><au>Romantsevich, V. I.</au><au>Uspenskii, M. B.</au><au>Chernov, R. V.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Analysis of reliability of semiconductor emitters with different designs of cavities</atitle><jtitle>Technical physics</jtitle><stitle>Tech. Phys</stitle><date>2016-10-01</date><risdate>2016</risdate><volume>61</volume><issue>10</issue><spage>1525</spage><epage>1530</epage><pages>1525-1530</pages><issn>1063-7842</issn><eissn>1090-6525</eissn><abstract>We have reported on the results of analysis of the operating time of conventional laser diodes and diodes with noninjecting output sections. The reasons for shorter operating time of diodes with a single anti-reflection face of the cavity compared to diodes with two protecting coatings and emitters equipped with a fiber Bragg grating have been considered.</abstract><cop>Moscow</cop><pub>Pleiades Publishing</pub><doi>10.1134/S1063784216100157</doi><tpages>6</tpages></addata></record>
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ispartof Technical physics, 2016-10, Vol.61 (10), p.1525-1530
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1090-6525
language eng
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source Springer Nature
subjects Analysis
Classical and Continuum Physics
Coatings
Emitters
Holes
Lasers
LEDs
Physics
Physics and Astronomy
Protective coatings
Reliability analysis
Repair & maintenance
Semiconductor lasers
Solid State Electronics
title Analysis of reliability of semiconductor emitters with different designs of cavities
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-14T13%3A57%3A15IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-gale_proqu&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Analysis%20of%20reliability%20of%20semiconductor%20emitters%20with%20different%20designs%20of%20cavities&rft.jtitle=Technical%20physics&rft.au=Ivanov,%20A.%20V.&rft.date=2016-10-01&rft.volume=61&rft.issue=10&rft.spage=1525&rft.epage=1530&rft.pages=1525-1530&rft.issn=1063-7842&rft.eissn=1090-6525&rft_id=info:doi/10.1134/S1063784216100157&rft_dat=%3Cgale_proqu%3EA495831641%3C/gale_proqu%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c307t-49e0b2173e7335a61bc7da364067f226be4c21ff8e8495eb1f20891e27d622963%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=1880852882&rft_id=info:pmid/&rft_galeid=A495831641&rfr_iscdi=true