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Grain Boundaries across Length Scales; Correlating SEM, Aberration-Corrected TEM Orientation Imaging and Nanospectroscopy

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Bibliographic Details
Published in:	Microscopy and microanalysis 2015-08, Vol.21 (S3), p.491-492
Main Authors:	Bowman, W. J., Darbal, A., Kelly, M., Rohrer, G.S., Hernandez, C.H., McGuinness, K., Crozier, P.A.
Format:	Article
Language:	English
Subjects:	A06 Advanced Analytical TEM/STEM Analytical and Instrumentation Science Symposia
Citations:	Items that this one cites
Online Access:	Get full text
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