Surface potential distribution of multilayer graphene using Kelvin probe and electric-field force microscopies

Surface properties of multilayer graphene (MLG) were studied by Kelvin Probe and Electric-field Force Microscopies (KPFM and EFM). Using KPFM, we observed an increase in the work function of MLG with increasing thickness. This is attributed to the surface π-electrons of p z orbitals shifting the Fer...

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Bibliographic Details
Published in:Ferroelectrics 2017-02, Vol.508 (1), p.115-123
Main Authors: Vidyasagar, R., Camargo, B., Romanyuk, K., Kholkin, A. L.
Format: Article
Language:English
Subjects:
EFM
Electric fields
Electric potential
Ferroelectric materials
Graphene
KPFM
Microscopy
Multilayers
potential
Surface properties
Work functions
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Summary:Surface properties of multilayer graphene (MLG) were studied by Kelvin Probe and Electric-field Force Microscopies (KPFM and EFM). Using KPFM, we observed an increase in the work function of MLG with increasing thickness. This is attributed to the surface π-electrons of p z orbitals shifting the Fermi level away from the Dirac point. EFM measurements indicate that the EFM phase increases with DC electric fields (−5 V ≤ V ≤ 5 V) applied to the probe. The parabolic phase-shift dependence is pertaining to the electrostatic interaction produced at the tip-MLG interface. These results provide future directions in band-gap engineering of graphene-based devices.
ISSN:0015-0193
1563-5112
DOI:10.1080/00150193.2017.1289583