Determining Junction Temperature of LEDs by the Relative Reflected Intensity of the Incident Exciting Light

Relative reflected intensity of the incident exciting light is proposed to measure the junction temperature of light-emitting diodes (LEDs) under test. Reflectance spectra at a wide junction temperature range are acquired. Multichannel optical fibers greatly increase the collecting efficiency of the...

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Bibliographic Details
Published in:IEEE transactions on electron devices 2017-05, Vol.64 (5), p.2257-2260
Main Authors: Xiao, Yao, Wu, Ting-Zhu, Dang, Si-Jia, Gao, Yu-Lin, Lin, Yue, Zhu, Li-Hong, Guo, Zi-Quan, Lu, Yi-Jun, Chen, Zhong
Format: Article
Language:English
Subjects:
Junctions
Light emitting diodes
light-emitting diodes (LED)
Luminous intensity
Modulation
Optical fibers
Organic light emitting diodes
Reflectance
reflection
Spectral emittance
spectroscopy
Table lookup
Temperature distribution
Temperature measurement
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Summary:Relative reflected intensity of the incident exciting light is proposed to measure the junction temperature of light-emitting diodes (LEDs) under test. Reflectance spectra at a wide junction temperature range are acquired. Multichannel optical fibers greatly increase the collecting efficiency of the reflected light. Lock-in technique is utilized to exclude the interference of the emitting light from LEDs under test and to increase the dynamic range greatly. The results are in good agreement with those directly tested by a microthermocouple. To avoid extra carrier absorption and modulation effect, the incident exciting light should harbor smaller bandgap than that of LEDs under test.
ISSN:0018-9383
1557-9646
DOI:10.1109/TED.2017.2678513