QoS metrics modeling and analysis for neighborhood area network in smart grid applications

Recently, planning and designing of smart‐grid (SG) neighborhood area network (NAN) communication architecture has drawn wide attention of researchers. In order to establish an SG NAN scheme satisfying the requirement, a quality of service (QoS) metric is a critical demand. However, there are few st...

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Bibliographic Details
Published in:IEEJ transactions on electrical and electronic engineering 2017-06, Vol.12 (S1), p.S79-S88
Main Authors: Le, Ngoc Thien, Benjapolakul, Watit
Format: Article
Language:English
Subjects:
advanced metering infrastructure (AMI)
Computer simulation
Criteria
Demand
Design analysis
Design engineering
Engineers
Mathematical models
Messages
neighborhood area network (NAN)
Quality of service
quality of service (QoS)
Quality of service architectures
Reliability
Smart grid
smart grid (SG)
S‐shaped curve
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Summary:Recently, planning and designing of smart‐grid (SG) neighborhood area network (NAN) communication architecture has drawn wide attention of researchers. In order to establish an SG NAN scheme satisfying the requirement, a quality of service (QoS) metric is a critical demand. However, there are few studies on the implementation of an efficient QoS metric model. In this paper, we propose an innovative QoS metric model for SG NAN design. By exploring the natural characteristics of SG messages in many applications, we choose the reliability and latency of a message as the most important criteria and implement the QoS curve for evaluating the performance of any candidate communication scheme. In addition, we present the evaluation model for QoS metrics of multiple SG services in NAN. Compared to other existing QoS methods, our model is easy to use and helps to reduce the time and cost in the planning and designing of a NAN for SG. Simulation and analysis results indicate good agreement with our proposed QoS model. © 2017 Institute of Electrical Engineers of Japan. Published by John Wiley & Sons, Inc.
ISSN:1931-4973
1931-4981
DOI:10.1002/tee.22442