Studying the boundary between the superconducting and stabilizing layers of a taped second-generation high-temperature superconductor

The composition and structure of the boundary between superconducting and stabilizing layers in a taped high-temperature superconductor of the second generation are studied by means of scanning and transmission electron microscopy. The superconducting and stabilizing layers are fabricated on the bas...

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Bibliographic Details
Published in:Bulletin of the Russian Academy of Sciences. Physics 2015-11, Vol.79 (11), p.1337-1339
Main Authors: Nikolaichik, V. I., Khodos, I. I., Klimenko, G. L., Koval’chuk, M. N.
Format: Article
Language:English
Subjects:
Hadrons
Heavy Ions
High temperature superconductors
Nuclear Physics
Physics
Physics and Astronomy
Proceedings of the XXV Russian Conference on Electron Microscopy (RCEM-2014)
Scanning electron microscopy
Silver
Superconductivity
Superconductors
Transmission electron microscopy
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Summary:The composition and structure of the boundary between superconducting and stabilizing layers in a taped high-temperature superconductor of the second generation are studied by means of scanning and transmission electron microscopy. The superconducting and stabilizing layers are fabricated on the basis of a GdBa 2 Cu 3 O y oxide layer and metallic silver, respectively. It is shown that nanosized pores 15–30 nm in diameter are located on the boundary from the side of silver layer. The presence of these pores likely determines the magnitude of the interface resistance between the superconducting and stabilizing layers.
ISSN:1062-8738
1934-9432
DOI:10.3103/S1062873815110179