X-ray photoelectron spectroscopy possibilities for analyzing the structural state of thin layers of oxide nanomaterials

A method is developed that enables us to enhance the capabilities of photoelectron spectroscopy to obtain data on the atomic structure of thin layers of oxide materials.

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Bibliographic Details
Published in:Bulletin of the Russian Academy of Sciences. Physics 2011-11, Vol.75 (11), p.1448-1453
Main Authors: Kanunnikova, O. M., Karban, O. V.
Format: Article
Language:English
Subjects:
Atomic structure
Hadrons
Heavy Ions
Nanomaterials
Nuclear Physics
Photoelectron spectroscopy
Physics
Physics and Astronomy
Proceedings of the 9th All-Russia Conference “Physicochemistry of Superdispersed Nanosystems”
Spectroscopic analysis
Spectrum analysis
Thin films
X-rays
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Description
Summary:A method is developed that enables us to enhance the capabilities of photoelectron spectroscopy to obtain data on the atomic structure of thin layers of oxide materials.
ISSN:1062-8738
1934-9432
DOI:10.3103/S106287381111013X