Adjustment of temperature coefficient of electrical resistivity in Cu66Zr34 metallic glass through surface oxidation induced phase decomposition

•Oxidation induced phase decomposition of the Cu66Zr34 metallic glass was studied.•Constant resistivity of oxidized ribbon with thickness of 20μm was obtained.•Such transformation provides a new approach to produce precision wire resistors. Amorphous Cu66Zr34 alloy decomposes into Cu, ZrO2, and resi...

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Bibliographic Details
Published in:Corrosion science 2017-08, Vol.125, p.166-174
Main Authors: Liu, Binbin, Han, Chaoyu, Ye, Feng
Format: Article
Language:English
Subjects:
A. Alloy
Alloys
Amorphous materials
B. TEM
C. Oxidation
C. Segregation
Copper base alloys
Decomposition
Electrical resistivity
Oxidation
Phase decomposition
Phase transitions
Resistors
Ribbons
Tapes (metallic)
Thin films
Zirconium dioxide
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Summary:•Oxidation induced phase decomposition of the Cu66Zr34 metallic glass was studied.•Constant resistivity of oxidized ribbon with thickness of 20μm was obtained.•Such transformation provides a new approach to produce precision wire resistors. Amorphous Cu66Zr34 alloy decomposes into Cu, ZrO2, and residual amorphous phase after oxidation, mainly due to differences between the oxygen affinity to Cu and Zr. A four-layer structure formed near the surface consisting of two oxidized layers, a transition region, and the matrix. The crystalline phases exhibited a gradient distribution along the thickness. The oxidized ribbons showed an adjustable temperature coefficient of electrical resistivity as a function of thickness. Near constant electrical resistivity (TCR≈0) could be obtained with a thickness of 20μm. Such transformation can be utilized for producing precision wires or thin-film chip resistors through oxidation.
ISSN:0010-938X
1879-0496
DOI:10.1016/j.corsci.2017.06.015