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Dynamic electrical behavior of halide perovskite based solar cells
A dynamic electrical model is introduced to investigate the hysteretic effects in the J-V characteristics of perovskite based solar cells. By making a simple ansatz for the polarization relaxation, our model is able to reproduce qualitatively and quantitatively detailed features of measured J-V char...
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Published in: | Solar energy materials and solar cells 2017-01, Vol.159, p.197-203 |
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Main Authors: | , , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | A dynamic electrical model is introduced to investigate the hysteretic effects in the J-V characteristics of perovskite based solar cells. By making a simple ansatz for the polarization relaxation, our model is able to reproduce qualitatively and quantitatively detailed features of measured J-V characteristics. Pre-poling effects are discussed, pointing out the differences between initially over- and under-polarized samples. In particular, the presence of the current overshoot observed in the reverse characteristics is correlated with the solar cell pre-conditioning. Furthermore, the dynamic hysteresis is analyzed with respect to changing the bias scan rate, the obtained results being consistent with experimentally reported data: the hysteresis amplitude is maximum at intermediate scan rates, while at very slow and very fast ones it becomes negligible. The effects induced by different relaxation time scales are assessed. The proposed dynamic electrical model offers a comprehensive view of the solar cell operation, being a practical tool for future calibration of tentative microscopic descriptions.
•A dynamic electrical model (DEM) is introduced to describe perovskite based solar cells.•The DEM reproduces hysteretic effects in the I-V characteristics observed experimentally.•The current overshoot in reverse is correlated with the solar cell pre-conditioning.•The dynamic hysteresis is analyzed with respect to changing the bias scan rate.•The DEM is a practical tool for future calibration of tentative microscopic descriptions. |
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ISSN: | 0927-0248 1879-3398 |
DOI: | 10.1016/j.solmat.2016.09.012 |