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A new efficient algorithm for finding all d-minimal cuts in multi-state networks
Reliability evaluation of multi-state systems gives a reasonable demonstration of system performance, and thus is of great importance to their planning, designing and operation. One of the common methods for reliability evaluation is using d-minimal cuts (d-MCs). This paper proposes a new method to...
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Published in: | Reliability engineering & system safety 2017-10, Vol.166, p.151-163 |
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Main Authors: | , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | Reliability evaluation of multi-state systems gives a reasonable demonstration of system performance, and thus is of great importance to their planning, designing and operation. One of the common methods for reliability evaluation is using d-minimal cuts (d-MCs). This paper proposes a new method to solve the d-MC problem. Specifically, several efforts have been devoted to searching for all d-MCs from two aspects: (i) A new technique is developed to calculate lower capacity bounds of edges which are appropriately used to determine some real d-MCs without any verification, and further to reduce the number of d-MC candidates; (ii) A new approach is put forward to correctly and effectively detect duplicate d-MCs, and the approach brings important insights into the underlying reason why a d-MC derived from one MC can be generated from another MC once again. A simple example and a real case study of the LCD monitor delivery are provided to illustrate the solution procedure, and the utility of the proposed algorithm, respectively. In addition, numerical experiments conducted on four benchmark networks show that the proposed algorithm outperforms a newly developed method in the literature.
•This paper proposes a new efficient algorithm to solve all d-minimal cuts (d-MCs).•A new technique is developed to find lower capacity bounds of edges.•A novel approach is put forward to effectively detect duplicate d-MCs.•The proposed approach brings new insights into the reason for duplicate d-MCs. |
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ISSN: | 0951-8320 1879-0836 |
DOI: | 10.1016/j.ress.2017.05.032 |