YFeO3 Photocathodes for Hydrogen Evolution

The behavior of YFeO3 thin-film electrodes under illumination is investigated for the first time. YFeO3 thin films on F-doped SnO2 (FTO) electrodes were prepared by two different methods (A) deposition of nanoparticles synthesized by the so-called ionic liquid route at 1000°C followed by sintering a...

Full description

Saved in:
Bibliographic Details
Published in:Electrochimica acta 2017-08, Vol.246, p.365-371
Main Authors: Díez-García, María Isabel, Celorrio, Verónica, Calvillo, Laura, Tiwari, Devendra, Gómez, Roberto, Fermín, David J.
Format: Article
Language:English
Subjects:
Band gap
band tails
Electrodes
Heat treating
Heat treatment
Hydrogen evolution
Ionic liquids
nanoparticles
Orthorhombic phase
Oxidation
perovskite
Photocathodes
photocurrent
Photoelectric effect
Photoelectric emission
Sol-gel processes
Spin coating
Thin films
Tin dioxide
Valence
YFeO3
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:The behavior of YFeO3 thin-film electrodes under illumination is investigated for the first time. YFeO3 thin films on F-doped SnO2 (FTO) electrodes were prepared by two different methods (A) deposition of nanoparticles synthesized by the so-called ionic liquid route at 1000°C followed by sintering at 400°C and (B) spin coating of a sol-gel precursor followed by a heat treatment at 640°C. Method A provides highly texture films with exquisite orthorhombic phase purity and a direct band gap transition at 2.45eV. On the other hand, method B results in very compact and amorphous films. XPS confirmed a Fe3+ oxidation state in both films, with a surface composition ratio of 70:30 Y:Fe. Both materials exhibit cathodic photocurrent responses arising from hydrogen evolution in alkaline solutions with an onset potential of 1.05V vs. RHE. The complex behavior of the photoresponses is rationalized in terms of recombination losses, band edge energy tails and hindered transport across the oxide thin film.
ISSN:0013-4686
1873-3859
DOI:10.1016/j.electacta.2017.06.025