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Analysis of cutoff frequency in one dimensional ternary superconducting photonic crystal

•Tuning of cut off frequency in ternary superconducting PC has been investigated.•Cut off frequency can be alter by the use of different combination of superconductor materials.•The structure can act as high pass filter, reflector etc. By means of two fluid model and transfer matrix method, we have...

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Bibliographic Details
Published in:Physica. C, Superconductivity Superconductivity, 2017-09, Vol.540, p.44-47
Main Authors: K.P., Sreejith, Maria D’souza, Nirmala, Mathew, Vincent
Format: Article
Language:English
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Summary:•Tuning of cut off frequency in ternary superconducting PC has been investigated.•Cut off frequency can be alter by the use of different combination of superconductor materials.•The structure can act as high pass filter, reflector etc. By means of two fluid model and transfer matrix method, we have theoretically investigated the transmittance property of a one dimensional ternary photonic crystal consist of a pair of superconducting materials and a dielectric in the infrared frequency region. We mainly focus on the analysis of cutoff frequency since the calculations can be useful in the fabrication of optical devices such as reflector, high pass filter etc. The study reveals that the cutoff frequency is sensitive to thickness of superconducting materials, dielectric layer thickness, operating temperature and refractive index of intermediate dielectric. Cutoff frequency shifted to higher frequency region on increasing number of periods and superconductor layer thickness where as it reduces on increasing dielectric thickness, operating temperature and refractive index of intermediate dielectric. Furthermore, we compared the cutoff frequency of three different 1D ternary photonic crystals comprising of a dielectric and a pair of high-high, high-low and low-low temperature superconducting materials. Our comparison results shows that the cutoff frequency can be effectively modified with different combination of superconducting materials.
ISSN:0921-4534
1873-2143
DOI:10.1016/j.physc.2017.07.010