Reliability: Fallacy or Reality?

As chip architects and manufacturers plumb ever-smaller process technologies, new species of faults are compromising device reliability, following an introduction by the authors debate whether reliability is a legitimate concern for the microarchitect. topics include the costs of adding reliability...

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Bibliographic Details
Published in:IEEE MICRO 2007-11, Vol.27 (6), p.36-45
Main Authors: Gonzalez, A., Mahlke, S., Mukherjee, S., Sendag, R., Chiou, D., Yi, J.J.
Format: Article
Language:English
Subjects:
and fault-tolerance
Architecture
arithmetic and logic structures
Arquitectura de computadors
Chips
Circuit faults
Circuits integrats
Computer architecture
Consumers
control structure reliability
control structures and microprogramming
Costs
Delay
Devices
Electrical fault detection
Electromigration
Fault detection
Faults
Fiabilitat
hardware
Informàtica
Integrated circuits
Manufacturing processes
memory structures
performance and reliability
Reliability
Semiconductor device measurement
Semiconductors
Temperature
testing
Voltage
Àrees temàtiques de la UPC
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Description
Summary:As chip architects and manufacturers plumb ever-smaller process technologies, new species of faults are compromising device reliability, following an introduction by the authors debate whether reliability is a legitimate concern for the microarchitect. topics include the costs of adding reliability versus those of ignoring it, how to measure it, techniques for improving it, and whether consumers really want it.
ISSN:0272-1732
1937-4143
DOI:10.1109/MM.2007.107