Reliability analysis for electronic devices using beta‐Weibull distribution

• Published in: Quality and reliability engineering international 2017-12, Vol.33 (8), p.2521-2530
• Main Authors: Méndez‐González, Luis Carlos, Rodríguez‐Picón, Luis Alberto, Valles‐Rosales, Delia Julieta, Romero‐López, Roberto, Quezada‐Carreón, Abel Eduardo
• Format: Article
• Language: English
• Subjects: Bayesian analysis; Bayesian estimation; beta‐Weibull distribution; Electronic devices; Failure analysis; Failure rates; inverse power law; Mean time to failure; Parameter estimation; Power law; reliability; Reliability analysis; Weibull distribution
• ISSN: 0748-8017; 1099-1638
• DOI: 10.1002/qre.2214

Today, in reliability analysis, the most used distribution to describe the behavior of electronic products under voltage profiles is the Weibull distribution. Nevertheless, the Weibull distribution does not provide a good fit to lifetime datasets that exhibit bathtub‐shaped or upside‐down bathtub–shaped (unimodal) failure rates, which are often encountered in the reliability analysis of electronic devices. In this paper, a reliability model based on the beta‐Weibull distribution and the inverse power law is proposed. This new model provides a better approach to model the performance and fit of the lifetimes of electronic devices. To estimate the parameters of the proposed model, a Bayesian analysis is used. A case study based on the lifetime of a surface mounted electrolytic capacitor is presented, the results showed that the estimation of the proposed model differs from the inverse power law–Weibull and that it affects directly the mean time to failure, the failure rate, the behavior, and the performance of the capacitor under analysis.