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Photoelectrocatalytic degradation of sugarcane factory wastewater using WO3/ZnO thin films
In the present work, layered WO 3 /ZnO thin films have been prepared by simple chemical spray pyrolysis method. As prepared films are characterized by photoelectrochemical (PEC) solar cell, X-ray diffraction (XRD), Raman spectroscopy, Field emission scanning electron microscopy (FE-SEM), Brunauer–Em...
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| Published in: | Journal of materials science. Materials in electronics 2018-03, Vol.29 (5), p.3808-3816 |
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| Main Authors: | , , , , |
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| container_issue | 5 |
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| container_title | Journal of materials science. Materials in electronics |
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| creator | Hunge, Y. M. Yadav, A. A. Mohite, B. M. Mathe, V. L. Bhosale, C. H. |
| description | In the present work, layered WO
3
/ZnO thin films have been prepared by simple chemical spray pyrolysis method. As prepared films are characterized by photoelectrochemical (PEC) solar cell, X-ray diffraction (XRD), Raman spectroscopy, Field emission scanning electron microscopy (FE-SEM), Brunauer–Emmer–Teller (BET) and energy dispersive X-ray spectroscopy techniques. XRD analysis reveals the formation of hexagonal and monoclinic phases of ZnO and WO
3
respectively. Raman analysis confirms the formation of layered WO
3
/ZnO thin films. FE-SEM images demonstrate that the surface morphology of layered WO
3
/ZnO consists of nano balls like morphology. The specific surface area of the layered WO
3
/ZnO thin film is found to be 65.12 m
2
g
−1
. The photoelectrocatalytic degradation properties of layered WO
3
/ZnO thin films were investigated by studying degradation of sugarcane factory wastewater. The end result shows that the degradation percentage of sugarcane factory wastewater using layered WO
3
/ZnO photo electrode has reached 94.44% after 100 min. under sunlight illumination. |
| doi_str_mv | 10.1007/s10854-017-8316-1 |
| format | article |
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3
/ZnO thin films have been prepared by simple chemical spray pyrolysis method. As prepared films are characterized by photoelectrochemical (PEC) solar cell, X-ray diffraction (XRD), Raman spectroscopy, Field emission scanning electron microscopy (FE-SEM), Brunauer–Emmer–Teller (BET) and energy dispersive X-ray spectroscopy techniques. XRD analysis reveals the formation of hexagonal and monoclinic phases of ZnO and WO
3
respectively. Raman analysis confirms the formation of layered WO
3
/ZnO thin films. FE-SEM images demonstrate that the surface morphology of layered WO
3
/ZnO consists of nano balls like morphology. The specific surface area of the layered WO
3
/ZnO thin film is found to be 65.12 m
2
g
−1
. The photoelectrocatalytic degradation properties of layered WO
3
/ZnO thin films were investigated by studying degradation of sugarcane factory wastewater. The end result shows that the degradation percentage of sugarcane factory wastewater using layered WO
3
/ZnO photo electrode has reached 94.44% after 100 min. under sunlight illumination.</description><identifier>ISSN: 0957-4522</identifier><identifier>EISSN: 1573-482X</identifier><identifier>DOI: 10.1007/s10854-017-8316-1</identifier><language>eng</language><publisher>New York: Springer US</publisher><subject>Characterization and Evaluation of Materials ; Chemistry and Materials Science ; Degradation ; Field emission microscopy ; Materials Science ; Morphology ; Optical and Electronic Materials ; Photovoltaic cells ; Scanning electron microscopy ; Spectrum analysis ; Spray pyrolysis ; Sugarcane ; Thin films ; Tungsten oxides ; Wastewater ; X-ray diffraction ; X-ray spectroscopy ; Zinc oxide</subject><ispartof>Journal of materials science. Materials in electronics, 2018-03, Vol.29 (5), p.3808-3816</ispartof><rights>Springer Science+Business Media, LLC, part of Springer Nature 2017</rights><rights>Journal of Materials Science: Materials in Electronics is a copyright of Springer, (2017). All Rights Reserved.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c353t-c83e89c386515f05e97bd27dd2aeb674e6a4694a60f086c8fefebae4d6352e7b3</citedby><cites>FETCH-LOGICAL-c353t-c83e89c386515f05e97bd27dd2aeb674e6a4694a60f086c8fefebae4d6352e7b3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27922,27923</link.rule.ids></links><search><creatorcontrib>Hunge, Y. M.</creatorcontrib><creatorcontrib>Yadav, A. A.</creatorcontrib><creatorcontrib>Mohite, B. M.</creatorcontrib><creatorcontrib>Mathe, V. L.</creatorcontrib><creatorcontrib>Bhosale, C. H.</creatorcontrib><title>Photoelectrocatalytic degradation of sugarcane factory wastewater using WO3/ZnO thin films</title><title>Journal of materials science. Materials in electronics</title><addtitle>J Mater Sci: Mater Electron</addtitle><description>In the present work, layered WO
3
/ZnO thin films have been prepared by simple chemical spray pyrolysis method. As prepared films are characterized by photoelectrochemical (PEC) solar cell, X-ray diffraction (XRD), Raman spectroscopy, Field emission scanning electron microscopy (FE-SEM), Brunauer–Emmer–Teller (BET) and energy dispersive X-ray spectroscopy techniques. XRD analysis reveals the formation of hexagonal and monoclinic phases of ZnO and WO
3
respectively. Raman analysis confirms the formation of layered WO
3
/ZnO thin films. FE-SEM images demonstrate that the surface morphology of layered WO
3
/ZnO consists of nano balls like morphology. The specific surface area of the layered WO
3
/ZnO thin film is found to be 65.12 m
2
g
−1
. The photoelectrocatalytic degradation properties of layered WO
3
/ZnO thin films were investigated by studying degradation of sugarcane factory wastewater. The end result shows that the degradation percentage of sugarcane factory wastewater using layered WO
3
/ZnO photo electrode has reached 94.44% after 100 min. under sunlight illumination.</description><subject>Characterization and Evaluation of Materials</subject><subject>Chemistry and Materials Science</subject><subject>Degradation</subject><subject>Field emission microscopy</subject><subject>Materials Science</subject><subject>Morphology</subject><subject>Optical and Electronic Materials</subject><subject>Photovoltaic cells</subject><subject>Scanning electron microscopy</subject><subject>Spectrum analysis</subject><subject>Spray pyrolysis</subject><subject>Sugarcane</subject><subject>Thin films</subject><subject>Tungsten oxides</subject><subject>Wastewater</subject><subject>X-ray diffraction</subject><subject>X-ray spectroscopy</subject><subject>Zinc oxide</subject><issn>0957-4522</issn><issn>1573-482X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2018</creationdate><recordtype>article</recordtype><recordid>eNp1kM1LwzAYh4MoOKd_gLeA57qkaT56lOEXDOZBUXYJafqm69iamaSM_fd21IMXT-_leX4vPAjdUnJPCZGzSIniRUaozBSjIqNnaEK5ZFmh8q9zNCEll1nB8_wSXcW4IYSIgqkJWr2tffKwBZuCtyaZ7TG1FtfQBFOb1PoOe4dj35hgTQfYGZt8OOKDiQkOJkHAfWy7Bn8u2WzVLXFatx127XYXr9GFM9sIN793ij6eHt_nL9li-fw6f1hklnGWMqsYqNIyJTjljnAoZVXnsq5zA5WQBQhTiLIwgjiihFUOHFQGilownoOs2BTdjbv74L97iElvfB-64aWm5WAyynM5UHSkbPAxBnB6H9qdCUdNiT4l1GNCPSTUp4SaDk4-OnFguwbCn-V_pR-qeXV5</recordid><startdate>20180301</startdate><enddate>20180301</enddate><creator>Hunge, Y. 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M. ; Mathe, V. L. ; Bhosale, C. 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M.</creatorcontrib><creatorcontrib>Yadav, A. A.</creatorcontrib><creatorcontrib>Mohite, B. M.</creatorcontrib><creatorcontrib>Mathe, V. L.</creatorcontrib><creatorcontrib>Bhosale, C. 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Materials in electronics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Hunge, Y. M.</au><au>Yadav, A. A.</au><au>Mohite, B. M.</au><au>Mathe, V. L.</au><au>Bhosale, C. H.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Photoelectrocatalytic degradation of sugarcane factory wastewater using WO3/ZnO thin films</atitle><jtitle>Journal of materials science. Materials in electronics</jtitle><stitle>J Mater Sci: Mater Electron</stitle><date>2018-03-01</date><risdate>2018</risdate><volume>29</volume><issue>5</issue><spage>3808</spage><epage>3816</epage><pages>3808-3816</pages><issn>0957-4522</issn><eissn>1573-482X</eissn><abstract>In the present work, layered WO
3
/ZnO thin films have been prepared by simple chemical spray pyrolysis method. As prepared films are characterized by photoelectrochemical (PEC) solar cell, X-ray diffraction (XRD), Raman spectroscopy, Field emission scanning electron microscopy (FE-SEM), Brunauer–Emmer–Teller (BET) and energy dispersive X-ray spectroscopy techniques. XRD analysis reveals the formation of hexagonal and monoclinic phases of ZnO and WO
3
respectively. Raman analysis confirms the formation of layered WO
3
/ZnO thin films. FE-SEM images demonstrate that the surface morphology of layered WO
3
/ZnO consists of nano balls like morphology. The specific surface area of the layered WO
3
/ZnO thin film is found to be 65.12 m
2
g
−1
. The photoelectrocatalytic degradation properties of layered WO
3
/ZnO thin films were investigated by studying degradation of sugarcane factory wastewater. The end result shows that the degradation percentage of sugarcane factory wastewater using layered WO
3
/ZnO photo electrode has reached 94.44% after 100 min. under sunlight illumination.</abstract><cop>New York</cop><pub>Springer US</pub><doi>10.1007/s10854-017-8316-1</doi><tpages>9</tpages></addata></record> |
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| ispartof | Journal of materials science. Materials in electronics, 2018-03, Vol.29 (5), p.3808-3816 |
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| language | eng |
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| source | Springer Nature |
| subjects | Characterization and Evaluation of Materials Chemistry and Materials Science Degradation Field emission microscopy Materials Science Morphology Optical and Electronic Materials Photovoltaic cells Scanning electron microscopy Spectrum analysis Spray pyrolysis Sugarcane Thin films Tungsten oxides Wastewater X-ray diffraction X-ray spectroscopy Zinc oxide |
| title | Photoelectrocatalytic degradation of sugarcane factory wastewater using WO3/ZnO thin films |
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