Loading…

Distribution of stems around the HV electrode in a 0.74-m air gap under positive pulses

A schlieren system with a temporal resolution of 5 μs and a spatial resolution of 70 μm was established; it was used to examine the spatial distribution of stems around different HV electrodes in a 0.74-m air gap under positive impulses. The results show that there is always more than one stem devel...

Full description

Saved in:
Bibliographic Details
Published in:IEEE transactions on dielectrics and electrical insulation 2018-02, Vol.25 (1), p.372-375
Main Authors: Jiang, Zhenglong, He, Junjia, Zhao, Xiangen, Xiao, Pei, Yang, Yongchao
Format: Article
Language:English
Subjects:
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
cited_by cdi_FETCH-LOGICAL-c291t-ab4a4129486024413254cc572735c805159dd28a62e8f0326a94414a49dc73343
cites cdi_FETCH-LOGICAL-c291t-ab4a4129486024413254cc572735c805159dd28a62e8f0326a94414a49dc73343
container_end_page 375
container_issue 1
container_start_page 372
container_title IEEE transactions on dielectrics and electrical insulation
container_volume 25
creator Jiang, Zhenglong
He, Junjia
Zhao, Xiangen
Xiao, Pei
Yang, Yongchao
description A schlieren system with a temporal resolution of 5 μs and a spatial resolution of 70 μm was established; it was used to examine the spatial distribution of stems around different HV electrodes in a 0.74-m air gap under positive impulses. The results show that there is always more than one stem developing from the HV electrode surface. On the basis of the high spatial resolution of schlieren photographs, the distribution of stems around the HV electrode is investigated considering the influence of the curvature radius of the electrode and the rising rate of the voltage impulse.
doi_str_mv 10.1109/TDEI.2018.006935
format article
fullrecord <record><control><sourceid>proquest_ieee_</sourceid><recordid>TN_cdi_proquest_journals_2014133058</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>8316728</ieee_id><sourcerecordid>2014133058</sourcerecordid><originalsourceid>FETCH-LOGICAL-c291t-ab4a4129486024413254cc572735c805159dd28a62e8f0326a94414a49dc73343</originalsourceid><addsrcrecordid>eNo9kM9LwzAUx4MoOKd3wUvAc-vLrzY5yjbdYOBl6rFkbaoZW1OTVPC_N6Xi6b3D5_N9jy9CtwRyQkA97JarTU6ByBygUEycoRkRQmacMHGedighU7KUl-gqhAMA4YIWM_S-tCF6ux-idR12LQ7RnALW3g1dg-Onwes3bI6mjt41BtsOawx5ybMT1tbjD93jBBqPexdstN8G98MxmHCNLlqdlpu_OUevT6vdYp1tX543i8dtVlNFYqb3XHNCFZcFUJ5-pYLXtShpyUQtQRChmoZKXVAjW2C00CpRyVFNXTLG2RzdT7m9d1-DCbE6uMF36WSVykiBDIRMFExU7V0I3rRV7-1J-5-KQDXWV431jYaspvqScjcp1hjzj0tGipJK9gtxgmhz</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2014133058</pqid></control><display><type>article</type><title>Distribution of stems around the HV electrode in a 0.74-m air gap under positive pulses</title><source>IEEE Xplore (Online service)</source><creator>Jiang, Zhenglong ; He, Junjia ; Zhao, Xiangen ; Xiao, Pei ; Yang, Yongchao</creator><creatorcontrib>Jiang, Zhenglong ; He, Junjia ; Zhao, Xiangen ; Xiao, Pei ; Yang, Yongchao</creatorcontrib><description>A schlieren system with a temporal resolution of 5 μs and a spatial resolution of 70 μm was established; it was used to examine the spatial distribution of stems around different HV electrodes in a 0.74-m air gap under positive impulses. The results show that there is always more than one stem developing from the HV electrode surface. On the basis of the high spatial resolution of schlieren photographs, the distribution of stems around the HV electrode is investigated considering the influence of the curvature radius of the electrode and the rising rate of the voltage impulse.</description><identifier>ISSN: 1070-9878</identifier><identifier>EISSN: 1558-4135</identifier><identifier>DOI: 10.1109/TDEI.2018.006935</identifier><identifier>CODEN: ITDIES</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Air gaps ; Corona ; Curvature ; Discharges (electric) ; Electrodes ; Lightning ; Positive discharge ; Positive impulse voltage ; schlieren system ; Spatial distribution ; Spatial resolution ; stem ; Surface discharges ; Switches ; Temporal resolution</subject><ispartof>IEEE transactions on dielectrics and electrical insulation, 2018-02, Vol.25 (1), p.372-375</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2018</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c291t-ab4a4129486024413254cc572735c805159dd28a62e8f0326a94414a49dc73343</citedby><cites>FETCH-LOGICAL-c291t-ab4a4129486024413254cc572735c805159dd28a62e8f0326a94414a49dc73343</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/8316728$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,27924,27925,54796</link.rule.ids></links><search><creatorcontrib>Jiang, Zhenglong</creatorcontrib><creatorcontrib>He, Junjia</creatorcontrib><creatorcontrib>Zhao, Xiangen</creatorcontrib><creatorcontrib>Xiao, Pei</creatorcontrib><creatorcontrib>Yang, Yongchao</creatorcontrib><title>Distribution of stems around the HV electrode in a 0.74-m air gap under positive pulses</title><title>IEEE transactions on dielectrics and electrical insulation</title><addtitle>T-DEI</addtitle><description>A schlieren system with a temporal resolution of 5 μs and a spatial resolution of 70 μm was established; it was used to examine the spatial distribution of stems around different HV electrodes in a 0.74-m air gap under positive impulses. The results show that there is always more than one stem developing from the HV electrode surface. On the basis of the high spatial resolution of schlieren photographs, the distribution of stems around the HV electrode is investigated considering the influence of the curvature radius of the electrode and the rising rate of the voltage impulse.</description><subject>Air gaps</subject><subject>Corona</subject><subject>Curvature</subject><subject>Discharges (electric)</subject><subject>Electrodes</subject><subject>Lightning</subject><subject>Positive discharge</subject><subject>Positive impulse voltage</subject><subject>schlieren system</subject><subject>Spatial distribution</subject><subject>Spatial resolution</subject><subject>stem</subject><subject>Surface discharges</subject><subject>Switches</subject><subject>Temporal resolution</subject><issn>1070-9878</issn><issn>1558-4135</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2018</creationdate><recordtype>article</recordtype><recordid>eNo9kM9LwzAUx4MoOKd3wUvAc-vLrzY5yjbdYOBl6rFkbaoZW1OTVPC_N6Xi6b3D5_N9jy9CtwRyQkA97JarTU6ByBygUEycoRkRQmacMHGedighU7KUl-gqhAMA4YIWM_S-tCF6ux-idR12LQ7RnALW3g1dg-Onwes3bI6mjt41BtsOawx5ybMT1tbjD93jBBqPexdstN8G98MxmHCNLlqdlpu_OUevT6vdYp1tX543i8dtVlNFYqb3XHNCFZcFUJ5-pYLXtShpyUQtQRChmoZKXVAjW2C00CpRyVFNXTLG2RzdT7m9d1-DCbE6uMF36WSVykiBDIRMFExU7V0I3rRV7-1J-5-KQDXWV431jYaspvqScjcp1hjzj0tGipJK9gtxgmhz</recordid><startdate>201802</startdate><enddate>201802</enddate><creator>Jiang, Zhenglong</creator><creator>He, Junjia</creator><creator>Zhao, Xiangen</creator><creator>Xiao, Pei</creator><creator>Yang, Yongchao</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>201802</creationdate><title>Distribution of stems around the HV electrode in a 0.74-m air gap under positive pulses</title><author>Jiang, Zhenglong ; He, Junjia ; Zhao, Xiangen ; Xiao, Pei ; Yang, Yongchao</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c291t-ab4a4129486024413254cc572735c805159dd28a62e8f0326a94414a49dc73343</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2018</creationdate><topic>Air gaps</topic><topic>Corona</topic><topic>Curvature</topic><topic>Discharges (electric)</topic><topic>Electrodes</topic><topic>Lightning</topic><topic>Positive discharge</topic><topic>Positive impulse voltage</topic><topic>schlieren system</topic><topic>Spatial distribution</topic><topic>Spatial resolution</topic><topic>stem</topic><topic>Surface discharges</topic><topic>Switches</topic><topic>Temporal resolution</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Jiang, Zhenglong</creatorcontrib><creatorcontrib>He, Junjia</creatorcontrib><creatorcontrib>Zhao, Xiangen</creatorcontrib><creatorcontrib>Xiao, Pei</creatorcontrib><creatorcontrib>Yang, Yongchao</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Xplore</collection><collection>CrossRef</collection><collection>Electronics &amp; Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE transactions on dielectrics and electrical insulation</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Jiang, Zhenglong</au><au>He, Junjia</au><au>Zhao, Xiangen</au><au>Xiao, Pei</au><au>Yang, Yongchao</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Distribution of stems around the HV electrode in a 0.74-m air gap under positive pulses</atitle><jtitle>IEEE transactions on dielectrics and electrical insulation</jtitle><stitle>T-DEI</stitle><date>2018-02</date><risdate>2018</risdate><volume>25</volume><issue>1</issue><spage>372</spage><epage>375</epage><pages>372-375</pages><issn>1070-9878</issn><eissn>1558-4135</eissn><coden>ITDIES</coden><abstract>A schlieren system with a temporal resolution of 5 μs and a spatial resolution of 70 μm was established; it was used to examine the spatial distribution of stems around different HV electrodes in a 0.74-m air gap under positive impulses. The results show that there is always more than one stem developing from the HV electrode surface. On the basis of the high spatial resolution of schlieren photographs, the distribution of stems around the HV electrode is investigated considering the influence of the curvature radius of the electrode and the rising rate of the voltage impulse.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/TDEI.2018.006935</doi><tpages>4</tpages></addata></record>
fulltext fulltext
identifier ISSN: 1070-9878
ispartof IEEE transactions on dielectrics and electrical insulation, 2018-02, Vol.25 (1), p.372-375
issn 1070-9878
1558-4135
language eng
recordid cdi_proquest_journals_2014133058
source IEEE Xplore (Online service)
subjects Air gaps
Corona
Curvature
Discharges (electric)
Electrodes
Lightning
Positive discharge
Positive impulse voltage
schlieren system
Spatial distribution
Spatial resolution
stem
Surface discharges
Switches
Temporal resolution
title Distribution of stems around the HV electrode in a 0.74-m air gap under positive pulses
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-29T08%3A30%3A06IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_ieee_&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Distribution%20of%20stems%20around%20the%20HV%20electrode%20in%20a%200.74-m%20air%20gap%20under%20positive%20pulses&rft.jtitle=IEEE%20transactions%20on%20dielectrics%20and%20electrical%20insulation&rft.au=Jiang,%20Zhenglong&rft.date=2018-02&rft.volume=25&rft.issue=1&rft.spage=372&rft.epage=375&rft.pages=372-375&rft.issn=1070-9878&rft.eissn=1558-4135&rft.coden=ITDIES&rft_id=info:doi/10.1109/TDEI.2018.006935&rft_dat=%3Cproquest_ieee_%3E2014133058%3C/proquest_ieee_%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c291t-ab4a4129486024413254cc572735c805159dd28a62e8f0326a94414a49dc73343%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=2014133058&rft_id=info:pmid/&rft_ieee_id=8316728&rfr_iscdi=true