Investigations of the Growth Processes of Bismuth-Germanate Crystals (Bi12GeO20) from the Melt using the X-Ray Diffraction Characteristics of Natural Lateral Faces

Single crystals of bismuth-germanate grown by the Czochralski method and possessing a combination of piezoelectric, electro-optical and magneto-optical characteristics are studied. The possibility of the non-destructive quality control of the grown crystals by X-ray diffraction investigation of thei...

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Bibliographic Details
Published in:Surface investigation, x-ray, synchrotron and neutron techniques x-ray, synchrotron and neutron techniques, 2018, Vol.12 (1), p.69-74
Main Authors: Mololkin, A. A., Protsenko, A. I., Blagov, A. E., Vinogradov, A. V., Lomonov, V. A., Pisarevskii, Yu. V., Targonskii, A. V., Eliovich, Ya. A.
Format: Article
Language:English
Subjects:
Bismuth
Chemistry and Materials Science
Crystals
Czochralski method
Diffraction
Materials Science
Optical properties
Piezoelectricity
Quality control
Single crystals
Surfaces and Interfaces
Thin Films
X-ray diffraction
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Summary:Single crystals of bismuth-germanate grown by the Czochralski method and possessing a combination of piezoelectric, electro-optical and magneto-optical characteristics are studied. The possibility of the non-destructive quality control of the grown crystals by X-ray diffraction investigation of their natural lateral faces is shown.
ISSN:1027-4510
1819-7094
DOI:10.1134/S1027451018010159