Influence of Ge addition on the optical properties of As40Se50Ge10 thin film probed by spectroscopy techniques

• Published in: Phase transitions 2018-05, Vol.91 (5), p.477
• Main Authors: Naik, Ramakanta, Pradhan, Jagnaseni, Sripan, Chinnaiyah, Ganesan, R
• Format: Article
• Language: English
• Subjects: Absorption; Absorptivity; Energy transmission; Evaporation; Glass substrates; Optical properties; Refractivity; Scanning electron microscopy; Thin films; X ray analysis; X-ray diffraction
• ISSN: 0141-1594; 1029-0338
• DOI: 10.1080/01411594.2018.1424337

The thin films of As40Se60 and As40Se50Ge10 were prepared on glass substrates by thermal evaporation method with thickness 1000 nm. The prepared films were amorphous in nature which was confirmed through X-ray diffraction. The chemical composition and the surface picture were obtained from energy dispersive X-ray analysis and Scanning Electron Microscopy analysis. The transmission data of the two films were collected in the wavelength range 400-1000 nm. The transmission percentage is found to be decreased whereas the absorption coefficient is increased with the Ge addition. The addition of Ge into As40Se60 is found to increase the refractive index and the extinction coefficient of As40Se50Ge10 thin film. The decrease in optical band gap is explained on the basis of increase in density of states and disorderness due to Ge addition. The optical absorption in the film is due to allowed indirect transition, and the homopolar bond density is increased with Ge addition. The Raman shift observed in the two films clearly supports the optical changes due to Ge addition.