Fabrication of solid-state secondary battery using semiconductors and evaluation of its charge/discharge characteristics

Li-ion batteries have attracted interest for use as storage batteries. However, the risk of fire has not yet been resolved. Although solid Li-ion batteries are possible alternatives, their performance characteristics are unsatisfactory. Recently, research on utilizing the accumulation of carriers at...

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Bibliographic Details
Published in:Japanese Journal of Applied Physics 2018-04, Vol.57 (4), p.41201
Main Authors: Sasaki, Atsuya, Sasaki, Akito, Hirabayashi, Hideaki, Saito, Shuichi, Aoki, Katsuaki, Kataoka, Yoshinori, Suzuki, Koji, Yabuhara, Hidehiko, Ito, Takahiro, Takagi, Shigeyuki
Format: Article
Language:English
Subjects:
Batteries
Discharge
Lithium
Lithium-ion batteries
N-type semiconductors
P-type semiconductors
Parallel plates
Rechargeable batteries
Semiconductors
Storage batteries
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Summary:Li-ion batteries have attracted interest for use as storage batteries. However, the risk of fire has not yet been resolved. Although solid Li-ion batteries are possible alternatives, their performance characteristics are unsatisfactory. Recently, research on utilizing the accumulation of carriers at the trap levels of semiconductors has been performed. However, the detailed charge/discharge characteristics and principles have not been reported. In this report, we attempted to form new n-type oxide semiconductor/insulator/p-type oxide semiconductor structures. The battery characteristics of these structures were evaluated by charge/discharge measurements. The obtained results clearly indicated the characteristics of rechargeable batteries. Furthermore, the fabricated structure accumulated an approximately 5000 times larger number of carriers than a parallel plate capacitor. Additionally, by constructing circuit models based on the experimental results, the charge/discharge mechanisms were considered. This is the first detailed experimental report on a rechargeable battery that operates without the double injection of ions and electrons.
ISSN:0021-4922
1347-4065
DOI:10.7567/JJAP.57.041201