Soft-error tolerance and energy consumption evaluation of embedded computer with magnetic random access memory in practical systems using computer simulations

We evaluated the soft-error tolerance and energy consumption of an embedded computer with magnetic random access memory (MRAM) using two computer simulators. One is a central processing unit (CPU) simulator of a typical embedded computer system. We simulated the radiation-induced single-event-upset...

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Bibliographic Details
Published in:Japanese Journal of Applied Physics 2017-08, Vol.56 (8), p.802
Main Authors: Nebashi, Ryusuke, Sakimura, Noboru, Sugibayashi, Tadahiko
Format: Article
Language:English
Subjects:
Central processing units
Computer memory
Computer simulation
CPUs
Embedded systems
Energy consumption
Energy dissipation
Errors
Radiation effects
Random access memory
Remote sensors
Simulators
Wireless sensor networks
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Summary:We evaluated the soft-error tolerance and energy consumption of an embedded computer with magnetic random access memory (MRAM) using two computer simulators. One is a central processing unit (CPU) simulator of a typical embedded computer system. We simulated the radiation-induced single-event-upset (SEU) probability in a spin-transfer-torque MRAM cell and also the failure rate of a typical embedded computer due to its main memory SEU error. The other is a delay tolerant network (DTN) system simulator. It simulates the power dissipation of wireless sensor network nodes of the system using a revised CPU simulator and a network simulator. We demonstrated that the SEU effect on the embedded computer with 1 Gbit MRAM-based working memory is less than 1 failure in time (FIT). We also demonstrated that the energy consumption of the DTN sensor node with MRAM-based working memory can be reduced to 1/11. These results indicate that MRAM-based working memory enhances the disaster tolerance of embedded computers.
ISSN:0021-4922
1347-4065
DOI:10.7567/JJAP.56.0802B6