Quantitative analysis of molecularly stacked layer structures in supported organic thin films by synchrotron grazing-incidence X-ray scattering

In this study, we derive a grazing‐incidence X‐ray scattering (GIXS) formula to analyze quantitatively GIXS patterns for molecularly stacked layer structures in substrate‐supported nanoscale thin films. We apply this formula in the quantitative analysis of GIXS patterns obtained for S‐docosanylcyste...

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Bibliographic Details
Published in:Journal of applied crystallography 2007-04, Vol.40 (s1), p.s669-s674
Main Authors: Yoon, Jinhwan, Choi, Seungchel, Jin, Sangwoo, Jin, Kyeong Sik, Heo, Kyuyoung, Ree, Moonhor
Format: Article
Language:English
Subjects:
Crystal structure
grazing-incidence X-ray scattering
molecularly stacked layer structure
Organic chemistry
orientation and distribution
Scattering
Thin films
X-rays
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Summary:In this study, we derive a grazing‐incidence X‐ray scattering (GIXS) formula to analyze quantitatively GIXS patterns for molecularly stacked layer structures in substrate‐supported nanoscale thin films. We apply this formula in the quantitative analysis of GIXS patterns obtained for S‐docosanylcysteine thin films on silicon substrates with native oxide layers. This analysis successfully provides information on the structural parameters and orientation of the molecular layer stack developed in S‐docosanylcysteine thin films.
ISSN:1600-5767
0021-8898
1600-5767
DOI:10.1107/S0021889806056056