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Influence of Isotropic Pressure on the Current–Voltage Characteristics of Surface-Barrier Diodes Sb–p-Si〈Mn〉–Au
The influence of hydrostatic pressure on the current–voltage characteristics of surface-barrier diode structures of the Sb– p -Si〈Mn〉–Au type are investigated. The potential-barrier height and the baric coefficient of its variation are found to be e ϕ δ = 0.75 eV and δ =–1.54 × 10 –11 eV/Pa, respect...
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Published in: | Semiconductors (Woodbury, N.Y.) N.Y.), 2018-08, Vol.52 (8), p.1027-1030 |
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container_issue | 8 |
container_start_page | 1027 |
container_title | Semiconductors (Woodbury, N.Y.) |
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creator | Zainabidinov, S. Tursunov, I. G. Khimmatkulov, O. |
description | The influence of hydrostatic pressure on the current–voltage characteristics of surface-barrier diode structures of the Sb–
p
-Si〈Mn〉–Au type are investigated. The potential-barrier height and the baric coefficient of its variation are found to be
e
ϕ
δ
= 0.75 eV and δ =–1.54 × 10
–11
eV/Pa, respectively. |
doi_str_mv | 10.1134/S1063782618080262 |
format | article |
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p
-Si〈Mn〉–Au type are investigated. The potential-barrier height and the baric coefficient of its variation are found to be
e
ϕ
δ
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–11
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p
-Si〈Mn〉–Au type are investigated. The potential-barrier height and the baric coefficient of its variation are found to be
e
ϕ
δ
= 0.75 eV and δ =–1.54 × 10
–11
eV/Pa, respectively.</description><subject>Coefficient of variation</subject><subject>Current voltage characteristics</subject><subject>Diodes</subject><subject>Hydrostatic pressure</subject><subject>Low-Dimensional Systems</subject><subject>Magnetic Materials</subject><subject>Magnetism</subject><subject>Physics</subject><subject>Physics and Astronomy</subject><subject>Quantum Phenomena</subject><subject>Semiconductor Structures</subject><issn>1063-7826</issn><issn>1090-6479</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2018</creationdate><recordtype>article</recordtype><recordid>eNp1kLtOwzAUhi0EEqXwAGyRmAO-xXHGUm6VikAKsEaOY7epShyOk6FbR5h5Q_oiuCoSA-Is5_Z__5EOQqcEnxPC-EVOsGCppIJILDEVdA8NCM5wLHia7W9rweLt_hAdeb_AmBCZ8AFaTRq77E2jTeRsNPGuA9fWOnoE430PYdpE3dxE4x7ANN3X-vPFLTs1C5O5AqU7A7Xvau23eN6DVdrElwqgNhBd1a4yPsrLgLVxXm_W7_fNZv0R2lF_jA6sWnpz8pOH6Pnm-ml8F08fbifj0TTWlBEam7TEWaqU0FhJIlllKJWS0yqphKwyhjXDpbWcJIQQzktVam6q1NqMBoHSbIjOdr4tuLfe-K5YuB6acLKgWCQ8BEuCiuxUGpz3YGzRQv2qYFUQXGw_XPz5cGDojvFB28wM_Dr_D30DjFCCRg</recordid><startdate>20180801</startdate><enddate>20180801</enddate><creator>Zainabidinov, S.</creator><creator>Tursunov, I. G.</creator><creator>Khimmatkulov, O.</creator><general>Pleiades Publishing</general><general>Springer Nature B.V</general><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20180801</creationdate><title>Influence of Isotropic Pressure on the Current–Voltage Characteristics of Surface-Barrier Diodes Sb–p-Si〈Mn〉–Au</title><author>Zainabidinov, S. ; Tursunov, I. G. ; Khimmatkulov, O.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c2312-e7b097aa6c0a8183de228842d5d68d930c30bff41511144babc4ed7ff92d68ac3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2018</creationdate><topic>Coefficient of variation</topic><topic>Current voltage characteristics</topic><topic>Diodes</topic><topic>Hydrostatic pressure</topic><topic>Low-Dimensional Systems</topic><topic>Magnetic Materials</topic><topic>Magnetism</topic><topic>Physics</topic><topic>Physics and Astronomy</topic><topic>Quantum Phenomena</topic><topic>Semiconductor Structures</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Zainabidinov, S.</creatorcontrib><creatorcontrib>Tursunov, I. G.</creatorcontrib><creatorcontrib>Khimmatkulov, O.</creatorcontrib><collection>CrossRef</collection><jtitle>Semiconductors (Woodbury, N.Y.)</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Zainabidinov, S.</au><au>Tursunov, I. G.</au><au>Khimmatkulov, O.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Influence of Isotropic Pressure on the Current–Voltage Characteristics of Surface-Barrier Diodes Sb–p-Si〈Mn〉–Au</atitle><jtitle>Semiconductors (Woodbury, N.Y.)</jtitle><stitle>Semiconductors</stitle><date>2018-08-01</date><risdate>2018</risdate><volume>52</volume><issue>8</issue><spage>1027</spage><epage>1030</epage><pages>1027-1030</pages><issn>1063-7826</issn><eissn>1090-6479</eissn><abstract>The influence of hydrostatic pressure on the current–voltage characteristics of surface-barrier diode structures of the Sb–
p
-Si〈Mn〉–Au type are investigated. The potential-barrier height and the baric coefficient of its variation are found to be
e
ϕ
δ
= 0.75 eV and δ =–1.54 × 10
–11
eV/Pa, respectively.</abstract><cop>Moscow</cop><pub>Pleiades Publishing</pub><doi>10.1134/S1063782618080262</doi><tpages>4</tpages></addata></record> |
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subjects | Coefficient of variation Current voltage characteristics Diodes Hydrostatic pressure Low-Dimensional Systems Magnetic Materials Magnetism Physics Physics and Astronomy Quantum Phenomena Semiconductor Structures |
title | Influence of Isotropic Pressure on the Current–Voltage Characteristics of Surface-Barrier Diodes Sb–p-Si〈Mn〉–Au |
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