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Influence of Isotropic Pressure on the Current–Voltage Characteristics of Surface-Barrier Diodes Sb–p-Si〈Mn〉–Au

The influence of hydrostatic pressure on the current–voltage characteristics of surface-barrier diode structures of the Sb– p -Si〈Mn〉–Au type are investigated. The potential-barrier height and the baric coefficient of its variation are found to be e ϕ δ = 0.75 eV and δ =–1.54 × 10 –11 eV/Pa, respect...

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Published in:Semiconductors (Woodbury, N.Y.) N.Y.), 2018-08, Vol.52 (8), p.1027-1030
Main Authors: Zainabidinov, S., Tursunov, I. G., Khimmatkulov, O.
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container_end_page 1030
container_issue 8
container_start_page 1027
container_title Semiconductors (Woodbury, N.Y.)
container_volume 52
creator Zainabidinov, S.
Tursunov, I. G.
Khimmatkulov, O.
description The influence of hydrostatic pressure on the current–voltage characteristics of surface-barrier diode structures of the Sb– p -Si〈Mn〉–Au type are investigated. The potential-barrier height and the baric coefficient of its variation are found to be e ϕ δ = 0.75 eV and δ =–1.54 × 10 –11 eV/Pa, respectively.
doi_str_mv 10.1134/S1063782618080262
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fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_journals_2065444435</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2065444435</sourcerecordid><originalsourceid>FETCH-LOGICAL-c2312-e7b097aa6c0a8183de228842d5d68d930c30bff41511144babc4ed7ff92d68ac3</originalsourceid><addsrcrecordid>eNp1kLtOwzAUhi0EEqXwAGyRmAO-xXHGUm6VikAKsEaOY7epShyOk6FbR5h5Q_oiuCoSA-Is5_Z__5EOQqcEnxPC-EVOsGCppIJILDEVdA8NCM5wLHia7W9rweLt_hAdeb_AmBCZ8AFaTRq77E2jTeRsNPGuA9fWOnoE430PYdpE3dxE4x7ANN3X-vPFLTs1C5O5AqU7A7Xvau23eN6DVdrElwqgNhBd1a4yPsrLgLVxXm_W7_fNZv0R2lF_jA6sWnpz8pOH6Pnm-ml8F08fbifj0TTWlBEam7TEWaqU0FhJIlllKJWS0yqphKwyhjXDpbWcJIQQzktVam6q1NqMBoHSbIjOdr4tuLfe-K5YuB6acLKgWCQ8BEuCiuxUGpz3YGzRQv2qYFUQXGw_XPz5cGDojvFB28wM_Dr_D30DjFCCRg</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2065444435</pqid></control><display><type>article</type><title>Influence of Isotropic Pressure on the Current–Voltage Characteristics of Surface-Barrier Diodes Sb–p-Si〈Mn〉–Au</title><source>Springer Nature</source><creator>Zainabidinov, S. ; Tursunov, I. G. ; Khimmatkulov, O.</creator><creatorcontrib>Zainabidinov, S. ; Tursunov, I. G. ; Khimmatkulov, O.</creatorcontrib><description>The influence of hydrostatic pressure on the current–voltage characteristics of surface-barrier diode structures of the Sb– p -Si〈Mn〉–Au type are investigated. The potential-barrier height and the baric coefficient of its variation are found to be e ϕ δ = 0.75 eV and δ =–1.54 × 10 –11 eV/Pa, respectively.</description><identifier>ISSN: 1063-7826</identifier><identifier>EISSN: 1090-6479</identifier><identifier>DOI: 10.1134/S1063782618080262</identifier><language>eng</language><publisher>Moscow: Pleiades Publishing</publisher><subject>Coefficient of variation ; Current voltage characteristics ; Diodes ; Hydrostatic pressure ; Low-Dimensional Systems ; Magnetic Materials ; Magnetism ; Physics ; Physics and Astronomy ; Quantum Phenomena ; Semiconductor Structures</subject><ispartof>Semiconductors (Woodbury, N.Y.), 2018-08, Vol.52 (8), p.1027-1030</ispartof><rights>Pleiades Publishing, Ltd. 2018</rights><rights>Copyright Springer Science &amp; Business Media 2018</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c2312-e7b097aa6c0a8183de228842d5d68d930c30bff41511144babc4ed7ff92d68ac3</citedby></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids></links><search><creatorcontrib>Zainabidinov, S.</creatorcontrib><creatorcontrib>Tursunov, I. G.</creatorcontrib><creatorcontrib>Khimmatkulov, O.</creatorcontrib><title>Influence of Isotropic Pressure on the Current–Voltage Characteristics of Surface-Barrier Diodes Sb–p-Si〈Mn〉–Au</title><title>Semiconductors (Woodbury, N.Y.)</title><addtitle>Semiconductors</addtitle><description>The influence of hydrostatic pressure on the current–voltage characteristics of surface-barrier diode structures of the Sb– p -Si〈Mn〉–Au type are investigated. The potential-barrier height and the baric coefficient of its variation are found to be e ϕ δ = 0.75 eV and δ =–1.54 × 10 –11 eV/Pa, respectively.</description><subject>Coefficient of variation</subject><subject>Current voltage characteristics</subject><subject>Diodes</subject><subject>Hydrostatic pressure</subject><subject>Low-Dimensional Systems</subject><subject>Magnetic Materials</subject><subject>Magnetism</subject><subject>Physics</subject><subject>Physics and Astronomy</subject><subject>Quantum Phenomena</subject><subject>Semiconductor Structures</subject><issn>1063-7826</issn><issn>1090-6479</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2018</creationdate><recordtype>article</recordtype><recordid>eNp1kLtOwzAUhi0EEqXwAGyRmAO-xXHGUm6VikAKsEaOY7epShyOk6FbR5h5Q_oiuCoSA-Is5_Z__5EOQqcEnxPC-EVOsGCppIJILDEVdA8NCM5wLHia7W9rweLt_hAdeb_AmBCZ8AFaTRq77E2jTeRsNPGuA9fWOnoE430PYdpE3dxE4x7ANN3X-vPFLTs1C5O5AqU7A7Xvau23eN6DVdrElwqgNhBd1a4yPsrLgLVxXm_W7_fNZv0R2lF_jA6sWnpz8pOH6Pnm-ml8F08fbifj0TTWlBEam7TEWaqU0FhJIlllKJWS0yqphKwyhjXDpbWcJIQQzktVam6q1NqMBoHSbIjOdr4tuLfe-K5YuB6acLKgWCQ8BEuCiuxUGpz3YGzRQv2qYFUQXGw_XPz5cGDojvFB28wM_Dr_D30DjFCCRg</recordid><startdate>20180801</startdate><enddate>20180801</enddate><creator>Zainabidinov, S.</creator><creator>Tursunov, I. G.</creator><creator>Khimmatkulov, O.</creator><general>Pleiades Publishing</general><general>Springer Nature B.V</general><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20180801</creationdate><title>Influence of Isotropic Pressure on the Current–Voltage Characteristics of Surface-Barrier Diodes Sb–p-Si〈Mn〉–Au</title><author>Zainabidinov, S. ; Tursunov, I. G. ; Khimmatkulov, O.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c2312-e7b097aa6c0a8183de228842d5d68d930c30bff41511144babc4ed7ff92d68ac3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2018</creationdate><topic>Coefficient of variation</topic><topic>Current voltage characteristics</topic><topic>Diodes</topic><topic>Hydrostatic pressure</topic><topic>Low-Dimensional Systems</topic><topic>Magnetic Materials</topic><topic>Magnetism</topic><topic>Physics</topic><topic>Physics and Astronomy</topic><topic>Quantum Phenomena</topic><topic>Semiconductor Structures</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Zainabidinov, S.</creatorcontrib><creatorcontrib>Tursunov, I. G.</creatorcontrib><creatorcontrib>Khimmatkulov, O.</creatorcontrib><collection>CrossRef</collection><jtitle>Semiconductors (Woodbury, N.Y.)</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Zainabidinov, S.</au><au>Tursunov, I. G.</au><au>Khimmatkulov, O.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Influence of Isotropic Pressure on the Current–Voltage Characteristics of Surface-Barrier Diodes Sb–p-Si〈Mn〉–Au</atitle><jtitle>Semiconductors (Woodbury, N.Y.)</jtitle><stitle>Semiconductors</stitle><date>2018-08-01</date><risdate>2018</risdate><volume>52</volume><issue>8</issue><spage>1027</spage><epage>1030</epage><pages>1027-1030</pages><issn>1063-7826</issn><eissn>1090-6479</eissn><abstract>The influence of hydrostatic pressure on the current–voltage characteristics of surface-barrier diode structures of the Sb– p -Si〈Mn〉–Au type are investigated. The potential-barrier height and the baric coefficient of its variation are found to be e ϕ δ = 0.75 eV and δ =–1.54 × 10 –11 eV/Pa, respectively.</abstract><cop>Moscow</cop><pub>Pleiades Publishing</pub><doi>10.1134/S1063782618080262</doi><tpages>4</tpages></addata></record>
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subjects Coefficient of variation
Current voltage characteristics
Diodes
Hydrostatic pressure
Low-Dimensional Systems
Magnetic Materials
Magnetism
Physics
Physics and Astronomy
Quantum Phenomena
Semiconductor Structures
title Influence of Isotropic Pressure on the Current–Voltage Characteristics of Surface-Barrier Diodes Sb–p-Si〈Mn〉–Au
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-03T01%3A05%3A47IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Influence%20of%20Isotropic%20Pressure%20on%20the%20Current%E2%80%93Voltage%20Characteristics%20of%20Surface-Barrier%20Diodes%20Sb%E2%80%93p-Si%E3%80%88Mn%E3%80%89%E2%80%93Au&rft.jtitle=Semiconductors%20(Woodbury,%20N.Y.)&rft.au=Zainabidinov,%20S.&rft.date=2018-08-01&rft.volume=52&rft.issue=8&rft.spage=1027&rft.epage=1030&rft.pages=1027-1030&rft.issn=1063-7826&rft.eissn=1090-6479&rft_id=info:doi/10.1134/S1063782618080262&rft_dat=%3Cproquest_cross%3E2065444435%3C/proquest_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c2312-e7b097aa6c0a8183de228842d5d68d930c30bff41511144babc4ed7ff92d68ac3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=2065444435&rft_id=info:pmid/&rfr_iscdi=true