Measurement-Based Method to Characterize Parasitic Parameters of the Integrated Power Electronics Modules

A measurement-based method for extracting the parasitic parameters of active power electronics modules (IPEMs) is proposed. Parasitic inductances and capacitances inside the IPEM can all be extracted using this method without destroying the structure. The linearized model is derived from impedance m...

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Bibliographic Details
Published in:IEEE transactions on power electronics 2007-01, Vol.22 (1), p.54-62
Main Authors: Liyu Yang, Odendaal, W.G.H.
Format: Article
Language:English
Subjects:
Accuracy
Applied sciences
Characterization
common-mode (CM)
Computer programs
Copper
Delta modulation
Design. Technologies. Operation analysis. Testing
differential mode (DM)
Electrical engineering. Electrical power engineering
electromagnetic compatibility (EMC)
Electromagnetic interference
electromagnetic interference (EMI)
Electronic equipment and fabrication. Passive components, printed wiring boards, connectics
Electronic modules
Electronics
Electronics packaging
Exact sciences and technology
Frequency
Impedance measurement
Integrated circuits
integrated power electronics modules (IPEMs)
Low frequencies
Magnetic devices
Magnetic noise
Mathematical models
measurement
noise
packaging
Parameter estimation
Parasitic capacitance
parasitic inductors
Power electronics
Power electronics, power supplies
Power measurement
Power supply
Semiconductor device noise
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Software
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Description
Summary:A measurement-based method for extracting the parasitic parameters of active power electronics modules (IPEMs) is proposed. Parasitic inductances and capacitances inside the IPEM can all be extracted using this method without destroying the structure. The linearized model is derived from impedance measurement and it is valid from low frequency to frequencies as high as 100 MHz. Extracted parameters are compared to those from commercial software and the results are in good agreement. A parallel resonance method is proposed for the characterization of common-mode capacitances
ISSN:0885-8993
1941-0107
DOI:10.1109/TPEL.2006.886615