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Model-independent measurements of the sodium magneto-optical trap's excited-state population
We present model-independent measurements of the excited-state population of atoms in a sodium (Na) magneto-optical trap (MOT) using a hybrid ion-neutral trap composed of a MOT and a linear Paul trap (LPT). We photoionize excited Na atoms trapped in the MOT and use two independent methods to measure...
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Published in: | arXiv.org 2018-04 |
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Main Authors: | , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Online Access: | Get full text |
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Summary: | We present model-independent measurements of the excited-state population of atoms in a sodium (Na) magneto-optical trap (MOT) using a hybrid ion-neutral trap composed of a MOT and a linear Paul trap (LPT). We photoionize excited Na atoms trapped in the MOT and use two independent methods to measure the resulting ions: directly by trapping them in our LPT, and indirectly by monitoring changes in MOT fluorescence. By measuring the ionization rate via these two independent methods, we have enough information to directly determine the population of MOT atoms in the excited-state. The resulting measurement reveals that there is a range of trapping-laser intensities where the excited-state population of atoms in our MOT follows the standard two-level model intensity-dependence. However, an experimentally determined effective saturation intensity must be used instead of the theoretically predicted value from the two-level model. We measured the effective saturation intensity to be \(I_\mathrm{se}=22.9(3)\:\textrm{mW}/\textrm{cm}^2\) for the type-I Na MOT and \(I_\mathrm{se}=48.9(7)\;\textrm{mW}/\textrm{cm}^2\) for the type-II Na MOT, approximately 1.7 and 3.6 times the theoretical estimate, respectively. Lastly, at large trapping-laser intensities, our experiment reveals a clear departure from the two-level model at a critical intensity that we believe is due to a state-mixing effect, whose critical intensity can be determined by a simple power broadening model. |
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ISSN: | 2331-8422 |
DOI: | 10.48550/arxiv.1802.05306 |