The Use of KF Style Flanges In Low Particulate Applications

As SCRF particle accelerator technology advances the need for "low particulate" and "particle free" vacuum systems becomes greater and greater. In the course of the operation of these systems, there comes a time when various instruments have to be temporarily attached for diagnos...

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Bibliographic Details
Published in:arXiv.org 2017-01
Main Authors: Kendziora, K R, Angelo, J, Baffes, C, Franck, D, Kellett, R
Format: Article
Language:English
Subjects:
Diagnostic systems
Flanges
Vacuum systems
Online Access:Get full text
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Summary:As SCRF particle accelerator technology advances the need for "low particulate" and "particle free" vacuum systems becomes greater and greater. In the course of the operation of these systems, there comes a time when various instruments have to be temporarily attached for diagnostic purposes: RGAs, leak detectors, and additional pumps. In an effort to make the additions of these instruments easier and more time effective, we propose to use KF style flanges for these types of temporary diagnostic connections. This document will describe the tests used to compare the particles generated using the assembly of the, widely accepted for "particle free" use, conflat flange to the proposed KF style flange, and demonstrate that KF flanges produce comparable or even less particles.
ISSN:2331-8422