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Analysis of etching at a solid-solid interface

We present a method to derive an analytical expression for the roughness of an eroded surface whose dynamics are ruled by cellular automaton. Starting from the automaton, we obtain the time evolution of the height average and height variance (roughness). We apply this method to the etching model in...

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Published in:arXiv.org 2017-07
Main Authors: Alves, Washington S, Rodrigues, Evandro A, Fernandes, Henrique A, Mello, Bernardo A, Oliveira, Fernando A, Costa, Ismael V L
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Oliveira, Fernando A
Costa, Ismael V L
description We present a method to derive an analytical expression for the roughness of an eroded surface whose dynamics are ruled by cellular automaton. Starting from the automaton, we obtain the time evolution of the height average and height variance (roughness). We apply this method to the etching model in 1 + 1 dimensions, and then we obtain the roughness exponent. Using this in conjunction with the Galilean invariance we obtain the other exponents, which perfectly match the numerical results obtained from simulations. These exponents are exact, and they are the same as those exhibited by the Kardar-Parisi-Zhang (KPZ) model for this dimension. Therefore, our results provide proof for the conjecture that the etching and KPZ models belong to the same universality class. Moreover, the method is general, and it can be applied to other cellular automata models.
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fullrecord <record><control><sourceid>proquest</sourceid><recordid>TN_cdi_proquest_journals_2075767298</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2075767298</sourcerecordid><originalsourceid>FETCH-LOGICAL-a528-53b8c858405b7565bb8095cf69a0604914caf6833fb4a929e587ec5d105ba863</originalsourceid><addsrcrecordid>eNotjktLAzEURoMgtNT-AHcB1zPePG5ysyzFFxRc6L7cSZM6ZZjRyVT03zuom_NtDh9HiGsFtSVEuOXxq_2slQdfAzryF2KpjVEVWa0XYl3KCQC08xrRLEW96bn7Lm2RQ5Zpim9tf5Q8SZZl6NpD9UvZ9lMaM8d0JS4zdyWt_3clXu7vXreP1e754Wm72VWMmio0DUVCsoCNR4dNQxAwZhcYHNigbOTsyJjcWA46JCSfIh7U7DM5sxI3f6_v4_BxTmXan4bzOIeWvQaPfo4PZH4AvO5Cxg</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2075767298</pqid></control><display><type>article</type><title>Analysis of etching at a solid-solid interface</title><source>Publicly Available Content Database</source><creator>Alves, Washington S ; Rodrigues, Evandro A ; Fernandes, Henrique A ; Mello, Bernardo A ; Oliveira, Fernando A ; Costa, Ismael V L</creator><creatorcontrib>Alves, Washington S ; Rodrigues, Evandro A ; Fernandes, Henrique A ; Mello, Bernardo A ; Oliveira, Fernando A ; Costa, Ismael V L</creatorcontrib><description>We present a method to derive an analytical expression for the roughness of an eroded surface whose dynamics are ruled by cellular automaton. Starting from the automaton, we obtain the time evolution of the height average and height variance (roughness). We apply this method to the etching model in 1 + 1 dimensions, and then we obtain the roughness exponent. Using this in conjunction with the Galilean invariance we obtain the other exponents, which perfectly match the numerical results obtained from simulations. These exponents are exact, and they are the same as those exhibited by the Kardar-Parisi-Zhang (KPZ) model for this dimension. Therefore, our results provide proof for the conjecture that the etching and KPZ models belong to the same universality class. Moreover, the method is general, and it can be applied to other cellular automata models.</description><identifier>EISSN: 2331-8422</identifier><identifier>DOI: 10.48550/arxiv.1707.05687</identifier><language>eng</language><publisher>Ithaca: Cornell University Library, arXiv.org</publisher><subject>Cellular automata ; Computer simulation ; Etching ; Exponents ; Mathematical models ; Roughness</subject><ispartof>arXiv.org, 2017-07</ispartof><rights>2017. This work is published under http://arxiv.org/licenses/nonexclusive-distrib/1.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.</rights><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://www.proquest.com/docview/2075767298?pq-origsite=primo$$EHTML$$P50$$Gproquest$$Hfree_for_read</linktohtml><link.rule.ids>778,782,25736,27908,36995,44573</link.rule.ids></links><search><creatorcontrib>Alves, Washington S</creatorcontrib><creatorcontrib>Rodrigues, Evandro A</creatorcontrib><creatorcontrib>Fernandes, Henrique A</creatorcontrib><creatorcontrib>Mello, Bernardo A</creatorcontrib><creatorcontrib>Oliveira, Fernando A</creatorcontrib><creatorcontrib>Costa, Ismael V L</creatorcontrib><title>Analysis of etching at a solid-solid interface</title><title>arXiv.org</title><description>We present a method to derive an analytical expression for the roughness of an eroded surface whose dynamics are ruled by cellular automaton. Starting from the automaton, we obtain the time evolution of the height average and height variance (roughness). We apply this method to the etching model in 1 + 1 dimensions, and then we obtain the roughness exponent. Using this in conjunction with the Galilean invariance we obtain the other exponents, which perfectly match the numerical results obtained from simulations. These exponents are exact, and they are the same as those exhibited by the Kardar-Parisi-Zhang (KPZ) model for this dimension. Therefore, our results provide proof for the conjecture that the etching and KPZ models belong to the same universality class. Moreover, the method is general, and it can be applied to other cellular automata models.</description><subject>Cellular automata</subject><subject>Computer simulation</subject><subject>Etching</subject><subject>Exponents</subject><subject>Mathematical models</subject><subject>Roughness</subject><issn>2331-8422</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2017</creationdate><recordtype>article</recordtype><sourceid>PIMPY</sourceid><recordid>eNotjktLAzEURoMgtNT-AHcB1zPePG5ysyzFFxRc6L7cSZM6ZZjRyVT03zuom_NtDh9HiGsFtSVEuOXxq_2slQdfAzryF2KpjVEVWa0XYl3KCQC08xrRLEW96bn7Lm2RQ5Zpim9tf5Q8SZZl6NpD9UvZ9lMaM8d0JS4zdyWt_3clXu7vXreP1e754Wm72VWMmio0DUVCsoCNR4dNQxAwZhcYHNigbOTsyJjcWA46JCSfIh7U7DM5sxI3f6_v4_BxTmXan4bzOIeWvQaPfo4PZH4AvO5Cxg</recordid><startdate>20170718</startdate><enddate>20170718</enddate><creator>Alves, Washington S</creator><creator>Rodrigues, Evandro A</creator><creator>Fernandes, Henrique A</creator><creator>Mello, Bernardo A</creator><creator>Oliveira, Fernando A</creator><creator>Costa, Ismael V L</creator><general>Cornell University Library, arXiv.org</general><scope>8FE</scope><scope>8FG</scope><scope>ABJCF</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>DWQXO</scope><scope>HCIFZ</scope><scope>L6V</scope><scope>M7S</scope><scope>PIMPY</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>PTHSS</scope></search><sort><creationdate>20170718</creationdate><title>Analysis of etching at a solid-solid interface</title><author>Alves, Washington S ; Rodrigues, Evandro A ; Fernandes, Henrique A ; Mello, Bernardo A ; Oliveira, Fernando A ; Costa, Ismael V L</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-a528-53b8c858405b7565bb8095cf69a0604914caf6833fb4a929e587ec5d105ba863</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2017</creationdate><topic>Cellular automata</topic><topic>Computer simulation</topic><topic>Etching</topic><topic>Exponents</topic><topic>Mathematical models</topic><topic>Roughness</topic><toplevel>online_resources</toplevel><creatorcontrib>Alves, Washington S</creatorcontrib><creatorcontrib>Rodrigues, Evandro A</creatorcontrib><creatorcontrib>Fernandes, Henrique A</creatorcontrib><creatorcontrib>Mello, Bernardo A</creatorcontrib><creatorcontrib>Oliveira, Fernando A</creatorcontrib><creatorcontrib>Costa, Ismael V L</creatorcontrib><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>Materials Science &amp; Engineering Collection</collection><collection>ProQuest Central (Alumni)</collection><collection>ProQuest Central</collection><collection>ProQuest Central Essentials</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Central</collection><collection>SciTech Premium Collection</collection><collection>ProQuest Engineering Collection</collection><collection>Engineering Database</collection><collection>Publicly Available Content Database</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><collection>Engineering Collection</collection><jtitle>arXiv.org</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Alves, Washington S</au><au>Rodrigues, Evandro A</au><au>Fernandes, Henrique A</au><au>Mello, Bernardo A</au><au>Oliveira, Fernando A</au><au>Costa, Ismael V L</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Analysis of etching at a solid-solid interface</atitle><jtitle>arXiv.org</jtitle><date>2017-07-18</date><risdate>2017</risdate><eissn>2331-8422</eissn><abstract>We present a method to derive an analytical expression for the roughness of an eroded surface whose dynamics are ruled by cellular automaton. Starting from the automaton, we obtain the time evolution of the height average and height variance (roughness). We apply this method to the etching model in 1 + 1 dimensions, and then we obtain the roughness exponent. Using this in conjunction with the Galilean invariance we obtain the other exponents, which perfectly match the numerical results obtained from simulations. These exponents are exact, and they are the same as those exhibited by the Kardar-Parisi-Zhang (KPZ) model for this dimension. Therefore, our results provide proof for the conjecture that the etching and KPZ models belong to the same universality class. Moreover, the method is general, and it can be applied to other cellular automata models.</abstract><cop>Ithaca</cop><pub>Cornell University Library, arXiv.org</pub><doi>10.48550/arxiv.1707.05687</doi><oa>free_for_read</oa></addata></record>
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subjects Cellular automata
Computer simulation
Etching
Exponents
Mathematical models
Roughness
title Analysis of etching at a solid-solid interface
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-17T01%3A02%3A09IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Analysis%20of%20etching%20at%20a%20solid-solid%20interface&rft.jtitle=arXiv.org&rft.au=Alves,%20Washington%20S&rft.date=2017-07-18&rft.eissn=2331-8422&rft_id=info:doi/10.48550/arxiv.1707.05687&rft_dat=%3Cproquest%3E2075767298%3C/proquest%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-a528-53b8c858405b7565bb8095cf69a0604914caf6833fb4a929e587ec5d105ba863%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=2075767298&rft_id=info:pmid/&rfr_iscdi=true