Functionalization of atomic force microscopy Akiyama tips for magnetic force microscopy measurements

In this work we have used focused electron beam induced deposition of cobalt to functionalize atomic force microscopy Akiyama tips for application in magnetic force microscopy. The grown tips have a content of 90% Co after exposure to ambient air. The magnetic tips were characterized using energy di...

Full description

Saved in:
Bibliographic Details
Published in:arXiv.org 2017-09
Main Authors: Stiller, Markus, Barzola-Quiquia, Jose, Esquinazi, Pablo D, Sangiao, Soraya, De Teresa, Jose M, Meijer, Jan, Abel, Bernd
Format: Article
Language:English
Subjects:
Atomic force microscopy
Coercivity
Electron beam lithography
Magnetic force microscopy
Magnetic properties
Room temperature
Tips
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:In this work we have used focused electron beam induced deposition of cobalt to functionalize atomic force microscopy Akiyama tips for application in magnetic force microscopy. The grown tips have a content of 90% Co after exposure to ambient air. The magnetic tips were characterized using energy dispersive X-ray spectroscopy and scanning electron microscopy. In order to investigate the magnetic properties, current loops were prepared by electron beam lithography. Measurements at room temperature as well as 4.2K were carried out and the coercive field of 68 Oe of the Co tip was estimated by applying several external fields in the opposite direction of the tip magnetization. Magnetic Akiyama tips open new possibilities for low to room-temperature magnetic force microscopy measurements.
ISSN:2331-8422