Biased doped silicene as a source for advanced electronics

Restructuring of electronic spectrum in a buckled silicene monolayer under some applied voltage between its two sublattices and in presence of certain impurity atoms is considered. A special attention is given to formation of localized impurity levels within the band gap and the to their collectiviz...

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Bibliographic Details
Published in:arXiv.org 2015-09
Main Authors: Pogorelov, Yuriy G, Loktev, Vadim M
Format: Article
Language:English
Subjects:
Band gap
Electric fields
Energy gap
Impurities
Insulators
Nanoelectronics
Nanotechnology devices
Perturbation
Phase transitions
Silicene
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Summary:Restructuring of electronic spectrum in a buckled silicene monolayer under some applied voltage between its two sublattices and in presence of certain impurity atoms is considered. A special attention is given to formation of localized impurity levels within the band gap and the to their collectivization at finite impurity concentration. It is shown that a qualitative restructuring of quasiparticle spectrum within the initial band gap and then specific metal-insulator phase transitions are possible for such disordered system and can be effectively controlled by variation of the electric field bias at given impurity perturbation potential and concentration. Since these effects are expected at low impurity concentrations but at not too low temperatures, they can be promising for practical applications in nanoelectronics devices.
ISSN:2331-8422
DOI:10.48550/arxiv.1509.03702