Femtosecond THz time domain spectroscopy at 36 kHz scan rate using an acousto-optic delay

We present a rapid-scan, time-domain terahertz spectrometer employing femtosecond Er:fiber technology and an acousto-optic delay with attosecond precision, enabling scanning of terahertz transients over a 12.4 ps time window at a waveform refresh rate of 36 kHz, and a signal-to-noise ratio of \(1.7...

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Bibliographic Details
Published in:arXiv.org 2016-04
Main Authors: Urbanek, B, Möller, M, Eisele, M, Baierl, S, Kaplan, D, Lange, C, Huber, R
Format: Article
Language:English
Subjects:
Acousto-optics
Delay
Electrons
Fiber technology
Mapping
Optical design
Polytetrafluoroethylene
Time domain analysis
Windows (intervals)
Online Access:Get full text
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Summary:We present a rapid-scan, time-domain terahertz spectrometer employing femtosecond Er:fiber technology and an acousto-optic delay with attosecond precision, enabling scanning of terahertz transients over a 12.4 ps time window at a waveform refresh rate of 36 kHz, and a signal-to-noise ratio of \(1.7 \times 10^5/\sqrt{\rm Hz}\). Our approach enables real-time monitoring of dynamic THz processes at unprecedented speeds, which we demonstrate through rapid 2D thickness mapping of a spinning teflon disc at a precision of \(10\,\rm nm/\sqrt{\rm Hz}\). The compact, all-optical design ensures alignment-free operation even in harsh environments.
ISSN:2331-8422
DOI:10.48550/arxiv.1604.03766