Onion-peeling inversion of stellarator images

An onion-peeling technique is developed for inferring the emissivity profile of a stellarator plasma from a two-dimensional image acquired through a CCD or CMOS camera. Each pixel in the image is treated as an integral of emission along a particular line-of-sight. Additionally, the flux surfaces in...

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Bibliographic Details
Published in:arXiv.org 2016-07
Main Authors: Hammond, K C, Diaz-Pacheco, R, Kornbluth, Y, Volpe, F A, Wei, Y
Format: Article
Language:English
Subjects:
CMOS
Emissivity
Image acquisition
Linear equations
Onions
Peeling
Topology
Online Access:Get full text
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Description
Summary:An onion-peeling technique is developed for inferring the emissivity profile of a stellarator plasma from a two-dimensional image acquired through a CCD or CMOS camera. Each pixel in the image is treated as an integral of emission along a particular line-of-sight. Additionally, the flux surfaces in the plasma are partitioned into discrete layers, each of which is assumed to have uniform emissivity. If the topology of the flux surfaces is known, this construction permits the development of a system of linear equations that can be solved for the emissivity of each layer. We present initial results of this method applied to wide-angle visible images of the CNT stellarator plasma.
ISSN:2331-8422
DOI:10.48550/arxiv.1606.03151